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100   $a20180524d2014      uy             0
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200 10$aLeakage current and defect characterization of short channel MOSFETs /$fGuntrade Roll
210  1$aBerlin :$cLogos Verlag Berlin,$d[2014]
210  4$dİ2014
215   $a1 online resource (242 pages)
225 0 $aResearch at NaMLab ;$v2
311   $a3-8325-3261-7 
606   $aMetal oxide semiconductor field-effect transistors
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615  0$aMetal oxide semiconductor field-effect transistors.
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997   $aUNINA