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035   $a(MiAaPQ)EBC4769016
035   $a(DE-B1597)466828
035   $a(OCoLC)1002266193
035   $a(OCoLC)1004883118
035   $a(OCoLC)1011453110
035   $a(OCoLC)967392298
035   $a(OCoLC)979912580
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035   $a(DE-B1597)9783110480153
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100   $a20161219h20162016  uy             0
101 0 $aeng
135   $aurcnu||||||||
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aMagnetic flux leakage $etheories and imaging technologies /$fSongling Huang, Wei Zhao
210  1$aBerlin, [Germany] ;$aBoston, [Massachusetts] :$cDe Gruyter,$d2016.
210  4$dİ2016
215   $a1 online resource (242 pages) $cillustrations
225 1 $aAdvances in Electrical and Electronic Engineering,$x2509-582X ;$vVolume 1
311   $a3-11-047701-7 
311   $a3-11-048015-8 
320   $aIncludes bibliographical references and index.
327   $tFrontmatter -- $tPreface -- $tContents -- $t1. Introduction -- $t2. Testing Signal Processing Method -- $t3. Quantitative Method of Magnetic Flux Leakage Testing -- $t4. Defect Profile Inversion of Three-Dimensional MFL Detection -- $t5. Three-Dimensional MFL Imaging Detection -- $tReferences -- $tIndex
410  0$aAdvances in electrical and electronic engineering ;$vVolume 1.
606   $aMagnetic testing
606   $aMagnetic flux
608   $aElectronic books.
615  0$aMagnetic testing.
615  0$aMagnetic flux.
676   $a620.11278
700   $aHuang$b Songling$0816195
702   $aZhao$b Wei
801  0$bMiAaPQ
801  1$bMiAaPQ
801  2$bMiAaPQ
906   $aBOOK
912   $a9910466324703321
996   $aMagnetic flux leakage$92469105
997   $aUNINA