LEADER 05247nam 2200637Ia 450 001 9910465410903321 005 20200520144314.0 010 $a1-299-28116-8 010 $a981-4439-08-8 035 $a(CKB)2560000000099525 035 $a(EBL)3050942 035 $a(OCoLC)922951762 035 $a(SSID)ssj0000907394 035 $a(PQKBManifestationID)12422923 035 $a(PQKBTitleCode)TC0000907394 035 $a(PQKBWorkID)10857662 035 $a(PQKB)11431353 035 $a(MiAaPQ)EBC3050942 035 $a(WSP)00002911 035 $a(Au-PeEL)EBL3050942 035 $a(CaPaEBR)ebr10674361 035 $a(CaONFJC)MIL459366 035 $a(EXLCZ)992560000000099525 100 $a20130319d2013 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aIAENG transactions on electrical engineering$b[electronic resource] $hVolume 1 $especial issue of the International Multiconference of Engineers and Computer Scientists 2012 /$feditors, Sio-Iong Ao ... [et al.] 210 $aSingapore ;$aHackensak, N. J. $cWorld Scientific Pub. Co.$dc2013 215 $a1 online resource (325 p.) 300 $aDescription based upon print version of record. 311 $a981-4439-07-X 320 $aIncludes bibliographical references. 327 $aCONTENTS; Preface; Low-Noise Measurements of Small Currents and Voltages for Characterization of Semiconductor Nanostructures at Low Temperatures J. Jacob and B. Fiedler; 1. Introduction; 2. Multi-Channel Pre-Amplification and Signal Conditioning System; 2.1. Input Amplifier Module; 2.2. Preliminary Filtering; 2.3. Universal Filter Matrix; 2.4. Output Stage; 2.5. Control and Power Supply; 2.6. Circuit Board Design; 2.7. Performance; 3. Battery-Powered Current and Voltage Amplification for Ultra-Low-Noise Measurements; 4. Conclusion; Acknowledgment; References 327 $aAn Integrated Approach to Power Quality Problems in Micro-Grids Tsao-Tsung Ma1. Introduction; 2. Micro-grid and Control Techniques; 2.1. Micro-grid Concepts and Power Quality Issues; 2.2. Control Techniques; 2.3. Calculation of Reference Current Commands; 3. Case Studies and Results; 3.1. Simulation Cases and Results; 3.2. Experimental Tests and Results; 4. Conclusion; Acknowledgments; References; Discriminating Among Inrush Current, External Short Circuit and Internal Winding Fault in Power Transformer Using Coefficient of DWT Jittiphong Klomjit and Atthapol Ngaopitakkul; 1. Introduction 327 $a2. Wavelet Transform3. Power System Simulation using EMTP; 4. Fault Detection Algorithm; 5. Conclusion; Acknowledgments; References; Classification of Temporal Characteristics of Epileptic EEG Subbands Based on the Local Maxima S. Janjarasjitt; 1. Introduction; 2. Methods; 2.1. Data and Subjects; 2.2. The Local Maxima and the Temporal Characteristics; 2.3. Analytical Framework; 3. Results; 4. Conclusions and Discussion; Acknowledgments; References 327 $aA Concurrent Error Detection and Correction Based Fault-Tolerant XOR-XNOR Circuit for Highly Reliable Applications Mouna Karmani, Chiraz Khedhiri, Belgacem Hamdi, Ka Lok Man, Eng Gee Lim and Chi-Un Lei1. Introduction; 2. Concurrent Error Detection and Correction Based Fault-Tolerant Systems; 2.1. The proposed XOR-XNOR circuit implementation; 2.2. Simulation results; 3. The XOR-XNOR Circuit Fault Analysis; 3.1. The stuck-at fault model; 3.2. The transistor stuck-on fault model; 3.3. The transistor stuck-on fault model; 4. The Proposed Concurrent Error Correction Architecture; 5. Conclusion 327 $aReferencesProbability Distributions on an AND-OR Tree Under Directional Algorithms Toshio Suzuki and Ryota Nakamura; 1. Introduction; 2. Notation; 3. The equivalence of eigen and E1; 4. A case where the uniqueness fails; 5. A case where the uniqueness holds; 6. Conclusive remarks; Acknowledgment; References; An Efficient Differential Full Adder Chiraz Khedhiri, Mouna Karmani, Belgacem Hamdi and Ka Lok Man; 1. Introduction; 1.1. The CMOS full adder; 1.2. The TGA full adder; 1.3. The Complementary Pass Transistor Logic CPL) full adder; 1.4. The Double Pass transistor Logic (DPL) full adder 327 $a1.5. The full adder in combined technology (CMOS+ DPL) 330 $aThis volume contains revised and extended research articles written by prominent researchers. Topics covered include electrical engineering, circuits, artificial intelligence, data mining, imaging engineering, bioinformatics, internet computing, software engineering, and industrial applications. The book offers tremendous state-of-the-art advances in electrical engineering and also serves as an excellent reference work for researchers and graduate students working with/on electrical engineering. 606 $aComputer engineering$vCongresses 606 $aEngineering$vCongresses 608 $aElectronic books. 615 0$aComputer engineering 615 0$aEngineering 676 $a621.3 701 $aAo$b Sio-Iong$0941557 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910465410903321 996 $aIAENG transactions on electrical engineering$92124124 997 $aUNINA