LEADER 02357nam 22005891 450 001 9910464888303321 005 20200520144314.0 010 $a3-03813-031-1 035 $a(CKB)3710000000025540 035 $a(EBL)1867695 035 $a(SSID)ssj0001189674 035 $a(PQKBManifestationID)11704373 035 $a(PQKBTitleCode)TC0001189674 035 $a(PQKBWorkID)11178072 035 $a(PQKB)11679964 035 $a(MiAaPQ)EBC1867695 035 $a(Au-PeEL)EBL1867695 035 $a(CaPaEBR)ebr10777887 035 $a(OCoLC)607839769 035 $a(EXLCZ)993710000000025540 100 $a20131101d2005 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 00$aDiffusion in silicon $ea seven-year retrospective /$feditor: D. J. Fisher 210 1$aDurnten-Zurich :$cTrans Tech Publications, Inc.,$d[2005] 210 4$dİ2005 215 $a1 online resource (210 p.) 225 1 $aDefect and Diffusion Forum ;$vVol. 241 300 $aDescription based upon print version of record. 311 $a3-908451-11-6 327 $aDiffusion in Silicon - A Seven-Year Retrospective; Table of Contents; Abstracts 330 $aThis collection of abstracts of experimental and theoretical papers on the subject of diffusion in silicon is intended to complement earlier volumes (DDF153-155) which covered the previous decade's work on the same topic. The abstracts are grouped according to the diffusing species in question. The latter comprise Ag, Al, As, Au, B, Ba, Be, C, Ca, Cl, Co, Cr, Cu, Er, F, Fe, Ge, H, He, Hf, In, Ir, K, Mg, Mn, Mo, N, Na, Nb, Ni, O, P, Pb, Pt, Rb, Sb, Se, Si, SiH3, Sn, Ti, V, Yb and Zn with regard to bulk diffusion, Ag, Au, Ba, Cl, Cu, Er, F, Ga, Ge, In, O, Pb, Sb, Si, SiH3, Sn and Y with regard t 410 0$aDiffusion and defect data.$nPt. A,$pDefect and diffusion forum ;$vv. 241. 606 $aSilicon 606 $aSilicon$xAnalysis 606 $aDiffusion 608 $aElectronic books. 615 0$aSilicon. 615 0$aSilicon$xAnalysis. 615 0$aDiffusion. 676 $a620.193 701 $aFisher$b D. J$0727312 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910464888303321 996 $aDiffusion in silicon$92183768 997 $aUNINA