LEADER 02971oam 2200649I 450 001 9910464434903321 005 20200520144314.0 010 $a0-429-14069-X 010 $a1-4200-8202-7 024 7 $a10.1201/b10415 035 $a(CKB)3390000000000075 035 $a(EBL)665647 035 $a(OCoLC)703152969 035 $a(SSID)ssj0000469837 035 $a(PQKBManifestationID)11280850 035 $a(PQKBTitleCode)TC0000469837 035 $a(PQKBWorkID)10531690 035 $a(PQKB)10002995 035 $a(MiAaPQ)EBC665647 035 $a(PPN)156181711 035 $a(Au-PeEL)EBL665647 035 $a(CaPaEBR)ebr10447928 035 $a(EXLCZ)993390000000000075 100 $a20180331d2011 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aHandbook of surface and nanometrology /$fDavid J. Whitehouse 205 $a2nd ed. 210 1$aBoca Raton :$cCRC Press,$d2011. 215 $a1 online resource (982 p.) 300 $aRev. ed. of: Handbook of surface metrology. c1994. 300 $aA Taylor & Francis book. 311 $a1-322-61470-9 311 $a1-4200-8201-9 320 $aIncludes bibliographical references and index. 327 $aFront cover; Dedication; Contents; Preface; Acknowledgments; Chapter 1. Introduction-Surface and Nanometrology; Chapter 2. Characterization; Chapter 3. Processing, Operations, and Simulations; Chapter 4. Measurement Techniques; Chapter 5. Standardization-Traceability-Uncertainty; Chapter 6. Surfaces and Manufacture; Chapter 7. Surface Geometry and Its Importance in Function; Chapter 8. Surface Geometry, Scale of Size Effects, Nanometrology; Chapter 9. General Comments; Glossary; Back cover 330 $aDavid Whitehouse, known as the father of digital metrology, helped pioneer the use of nanotechnology in surface science and surface metrology, and he continues to move the field forward. In this heavily revised and expanded edition, he addresses the many paradigm shifts occurring in the field. He explains the incorporation of physics to develop optimum solutions for manufacture and performance, and provides mechanical engineers with accessible explanations of essential concepts along with the higher mathematics that is now required of those working in the field. Emphasis is placed on systems w 606 $aSurfaces (Technology)$xMeasurement 606 $aNanostructured materials 606 $aMetrology 608 $aElectronic books. 615 0$aSurfaces (Technology)$xMeasurement. 615 0$aNanostructured materials. 615 0$aMetrology. 676 $a620/.440287 700 $aWhitehouse$b D. J$g(David J.), 701 $aWhitehouse$b D. J$g(David J.).$0888020 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910464434903321 996 $aHandbook of surface and nanometrology$91983592 997 $aUNINA LEADER 01336nam 2200457 450 001 9910520005103321 005 20200520144314.0 010 $a1-909821-30-6 035 $a(CKB)3830000000059933 035 $a(MiAaPQ)EBC5485108 035 $a(Au-PeEL)EBL5485108 035 $a(OCoLC)1048796156 035 $a(EXLCZ)993830000000059933 100 $a20180823h20162006 uy 0 101 0 $aeng 135 $aurcnu|||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 14$aThe Mystical Origins of Hasidism 210 1$aOxford ;$aPortland, Oregon :$cThe Littman Library of Jewish Civilization,$d2016. 210 4$dİ2006 215 $a1 online resource (272 pages) 225 1 $aThe Littman Library of Jewish Civilization 311 $a1-904113-04-4 311 $a1-874774-84-6 410 0$aLittman library of Jewish civilization (Series) 606 $aHasidism$xHistory 606 $aHasidism$xPhilosophy 608 $aElectronic books. 615 0$aHasidism$xHistory. 615 0$aHasidism$xPhilosophy. 676 $a296.833 700 $aElior$b Rachel$0946214 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910520005103321 996 $aThe Mystical Origins of Hasidism$92584495 997 $aUNINA