LEADER 02820oam 2200673I 450 001 9910463021903321 005 20200520144314.0 010 $a0-429-08792-6 010 $a1-61583-947-X 010 $a90-04-19095-3 024 7 $a10.1201/b12181 035 $a(CKB)2670000000311395 035 $a(EBL)1109848 035 $a(OCoLC)827211774 035 $a(SSID)ssj0000595843 035 $a(PQKBManifestationID)11392923 035 $a(PQKBTitleCode)TC0000595843 035 $a(PQKBWorkID)10575121 035 $a(PQKB)10410158 035 $a(MiAaPQ)EBC1109848 035 $a(Au-PeEL)EBL1109848 035 $a(CaPaEBR)ebr10644872 035 $a(CaONFJC)MIL501668 035 $a(OCoLC)713869534 035 $a(EXLCZ)992670000000311395 100 $a20180331d2010 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 00$aAdhesion aspects in MEMS-NEMS /$fedited by S. H. Kim, M. T. Dugger and K. L. Mittal 210 1$aLeiden ;$aBoston :$cBrill ;$aBiggleswade :$cExtenza Turpin [distributor],$d2010. 215 $a1 online resource (424 p.) 300 $aDescription based upon print version of record. 311 $a90-04-19094-5 320 $aIncludes bibliographical references. 327 $apt. 1. Understanding through continuum theory -- pt. 2. Computer simulation of interfaces -- pt. 3. Adhesion and friction measurements -- pt. 4. Adhesion in practical applications -- pt. 5. Adhesion mitigation strategies. 330 $aPhenomena associated with the adhesion interaction of surfaces have been a critical aspect of micro- and nanosystem development and performance since the first MicroElectroMechanicalSystems(MEMS) were fabricated. These phenomena are ubiquitous in nature and are present in all systems, however MEMS devices are particularly sensitive to their effects owing to their small size and limited actuation force that can be generated. Extension of MEMS technology concepts to the nanoscale and development of NanoElectroMechanicalSystems(NEMS) will result in systems even more strongly influenced by surface 606 $aMicroelectromechanical systems 606 $aNanoelectromechanical systems 606 $aAdhesion 606 $aSurfaces (Technology) 608 $aElectronic books. 615 0$aMicroelectromechanical systems. 615 0$aNanoelectromechanical systems. 615 0$aAdhesion. 615 0$aSurfaces (Technology) 676 $a621.381 701 $aKim$b Seong H$0856168 701 $aDugger$b Michael T$0856169 701 $aMittal$b K. L.$f1945-$0748276 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910463021903321 996 $aAdhesion aspects in MEMS-NEMS$91911576 997 $aUNINA