LEADER 02860nam 22005651 450 001 9910462781003321 005 20200520144314.0 010 $a3-03813-208-X 035 $a(CKB)2670000000348181 035 $a(EBL)1869212 035 $a(SSID)ssj0001127799 035 $a(PQKBManifestationID)11717880 035 $a(PQKBTitleCode)TC0001127799 035 $a(PQKBWorkID)11151998 035 $a(PQKB)11395528 035 $a(MiAaPQ)EBC1869212 035 $a(Au-PeEL)EBL1869212 035 $a(CaPaEBR)ebr10777856 035 $a(OCoLC)897070548 035 $a(EXLCZ)992670000000348181 100 $a20131101d2008 uy 0 101 0 $aeng 135 $aurcnu|||||||| 181 $ctxt 182 $cc 183 $acr 200 00$aDefects and diffusion in semiconductors$hXI $ean annual retrospective /$fD.J. Fisher 210 1$aStafa-Zuerich, Switzerland :$cTTP, Trans Tech Publications,$d[2008] 210 4$dİ2008 215 $a1 online resource (160 p.) 225 1 $aDefects and diffusion forum,$x1012-0386 ;$vv. 282 300 $aDescription based upon print version of record. 311 $a3-908451-63-9 320 $aIncludes bibliographical references and indexes. 327 $aDefects and Diffusion in Semicondutors, 2009; Table of Contents; Structural and Electron-Hopping Studies of Pr and Nd Substituted La2/3Ba1/3MnO3 Manganites; Recrystallization Annealing of Cold Rolled 9Cr 1Mo Ferritic Steel Containing Silicon; Quantitative Concept for Morphological Stability Analysis of Liquid-Solid Interface in Rapid Solidification of Dilute Binary Alloys; Studies of the Spin Hamiltonian Parameters for NiX2 and CdX2:Ni2+ (X=Cl, Br); Abstracts; Keywords Index; Authors Index 330 $aThis eleventh volume in the series covering the latest results in the field includes abstracts of papers which have appeared since the publication of Annual Retrospective X (Volume 272). As well as the 295 metals abstracts, the issue includes - in line with the new editorial policy of including original papers on all of the major material groups: ""Structural and Electron-Hopping Studies of Pr- and Nd-Substituted La2/3Ba1/3MnO3 Manganites"" (H.Abdullah and S.A.Halim), ""Recrystallization Annealing of Cold-Rolled 9Cr-1Mo Ferritic Steel Containing Silicon"" (M.N.Mungole, M.Surender, R.Balasubram 410 0$aDiffusion and defect data.$nPt. A,$pDefect and diffusion forum ;$vv. 282. 606 $aSemiconductors$xDefects 606 $aSemiconductors$xDiffusion 608 $aElectronic books. 615 0$aSemiconductors$xDefects. 615 0$aSemiconductors$xDiffusion. 701 $aFisher$b D. J$0727312 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910462781003321 996 $aDefects and diffusion in semiconductors$91918009 997 $aUNINA LEADER 01223nam0 2200325 i 450 001 TO00329951 005 20251003044404.0 010 $a8834840844 020 $aIT$b95-5992 100 $a20240201d1994 ||||0itac50 ba 101 | $aita 102 $ait 181 1$6z01$ai $bxxxe 182 1$6z01$an 183 1$6z01$anc$2RDAcarrier 200 1 $aEsercizi di matematica$ediseguaglianze, vettori, matrici e sistemi lineari, funzioni$ealcuni concetti generali, limiti, derivate, grafici$fMassimiliano Ottaviani 205 $a2. ed 210 $aTorino$cG. Giappichelli$d\1994! 215 $aVIII, 259 p.$d24 cm. 606 $aMatematica$xEsercizi$2FIR$3CFIC006232$9E 676 $a510.76$9Matematica. Prontuari scolastici ed esercizi$v23 700 1$aOttaviani$b, Massimiliano$3MILV045442$4070$0104448 801 3$aIT$bIT-000000$c20240201 850 $aIT-BN0095 901 $bNAP 01$cM/S $n$ 912 $aTO00329951 950 0$aBiblioteca Centralizzata di Ateneo$c1 v.$d 01M/S (AR) 17 898$e 01AR 0700178985 VMA A4 1 v.$fY $h20240201$i20240201 977 $a 01 996 $aEsercizi di matematica$9436468 997 $aUNISANNIO