LEADER 00902nam0-2200325---450- 001 990008583470403321 005 20071116104147.0 010 $a88-7589-116-8 035 $a000858347 035 $aFED01000858347 035 $a(Aleph)000858347FED01 035 $a000858347 100 $a20071116d2005----km-y0itay50------ba 101 0 $aita 102 $aIT 105 $ay-------001yy 200 1 $a<>risarcimento del danno da fumo$fEdoardo Adducci, Carlo Filadoro 210 $aMatelica$cHalley$dstampa 2005 215 $a223 p.$d24 cm 225 1 $aProfessionisti 676 $a346.45032302648$v21$zita 700 1$aAdducci,$bEdoardo$0502776 701 1$aFiladoro,$bCarlo$0502777 801 0$aIT$bUNINA$gRICA$2UNIMARC 901 $aBK 912 $a990008583470403321 952 $aL 667$bs.i.$fDSS 959 $aDSS 996 $aRisarcimento del danno da fumo$9710437 997 $aUNINA LEADER 01954nam 2200577Ia 450 001 9910455515403321 005 20200520144314.0 010 $a1-282-16996-3 010 $a9786612169960 010 $a90-272-9029-6 035 $a(CKB)1000000000765616 035 $a(SSID)ssj0000182303 035 $a(PQKBManifestationID)11164448 035 $a(PQKBTitleCode)TC0000182303 035 $a(PQKBWorkID)10171567 035 $a(PQKB)10176767 035 $a(MiAaPQ)EBC622712 035 $a(Au-PeEL)EBL622712 035 $a(CaPaEBR)ebr10314066 035 $a(CaONFJC)MIL216996 035 $a(OCoLC)436094068 035 $a(EXLCZ)991000000000765616 100 $a20090219d2009 uy 0 101 0 $aeng 135 $aurcn||||||||| 181 $ctxt 182 $cc 183 $acr 200 10$aIntroducing Maltese linguistics$b[electronic resource] $eselected papers from the 1st International Conference on Maltese Linguistics, Bremen, 18-20 October, 2007 /$fedited by Bernard Comrie ... [et al.] 210 $aAmsterdam ;$aPhiladelphia $cJohn Benjamins Pub. Co.$dc2009 215 $axi, 422 p. $cill 225 1 $aStudies in language companion series,$x0165-7763 ;$vv. 113 300 $aBibliographic Level Mode of Issuance: Monograph 311 $a90-272-0580-9 320 $aIncludes bibliographical references and indexes. 410 0$aStudies in language companion series ;$vv. 113. 606 $aMaltese language$vCongresses 606 $aMaltese language$xGrammar$vCongresses 608 $aElectronic books. 615 0$aMaltese language 615 0$aMaltese language$xGrammar 676 $a492.7/9 701 $aComrie$b Bernard$f1947-$0152014 712 12$aInternational Conference on Maltese Linguistics 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910455515403321 996 $aIntroducing Maltese linguistics$92245050 997 $aUNINA LEADER 06244nam 2200841 a 450 001 9910822805803321 005 20240516061144.0 010 $a9786613204578 010 $a9781119979906 010 $a1119979900 010 $a9781283204576 010 $a1283204576 010 $a9781119978848 010 $a111997884X 010 $a9781119978855 010 $a1119978858 035 $a(CKB)2550000000043053 035 $a(EBL)693217 035 $a(OCoLC)751695083 035 $a(SSID)ssj0000529387 035 $a(PQKBManifestationID)12200145 035 $a(PQKBTitleCode)TC0000529387 035 $a(PQKBWorkID)10552903 035 $a(PQKB)11124748 035 $a(MiAaPQ)EBC693217 035 $a(Au-PeEL)EBL693217 035 $a(CaPaEBR)ebr10488537 035 $a(CaONFJC)MIL320457 035 $a(Perlego)1014093 035 $a(EXLCZ)992550000000043053 100 $a20110510d2011 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 00$aAberration-corrected analytical transmission electron microscopy /$fedited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks 205 $a1st ed. 210 $aHoboken, N.J. $cWiley$d2011 215 $a1 online resource (306 p.) 225 1 $aRMS - Royal Microscopical Society 300 $aDescription based upon print version of record 311 08$a9780470518519 311 08$a0470518510 320 $aIncludes bibliographical references and index. 327 $aAberration-Corrected Analytical Transmission Electron Microscopy; Contents; List of Contributors; Preface; 1 General Introduction to Transmission Electron Microscopy (TEM); 1.1 What TEM Offers; 1.2 Electron Scattering; 1.2.1 Elastic Scattering; 1.2.2 Inelastic Scattering; 1.3 Signals which could be Collected; 1.4 Image Computing; 1.4.1 Image Processing; 1.4.2 Image Simulation; 1.5 Requirements of a Specimen; 1.6 STEM Versus CTEM; 1.7 Two Dimensional and Three Dimensional Information; 2 Introduction to Electron Optics; 2.1 Revision of Microscopy with Visible Light and Electrons 327 $a2.2 Fresnel and Fraunhofer Diffraction2.3 Image Resolution; 2.4 Electron Lenses; 2.4.1 Electron Trajectories; 2.4.2 Aberrations; 2.5 Electron Sources; 2.6 Probe Forming Optics and Apertures; 2.7 SEM, TEM and STEM; 3 Development of STEM; 3.1 Introduction: Structural and Analytical Information in Electron Microscopy; 3.2 The Crewe Revolution: How STEM Solves the Information Problem; 3.3 Electron Optical Simplicity of STEM; 3.4 The Signal Freedom of STEM; 3.4.1 Bright-Field Detector (Phase Contrast, Diffraction Contrast); 3.4.2 ADF, HAADF; 3.4.3 Nanodiffraction; 3.4.4 EELS; 3.4.5 EDX 327 $a3.4.6 Other Techniques3.5 Beam Damage and Beam Writing; 3.6 Correction of Spherical Aberration; 3.7 What does the Future Hold?; 4 Lens Aberrations: Diagnosis and Correction; 4.1 Introduction; 4.2 Geometric Lens Aberrations and Their Classification; 4.3 Spherical Aberration-Correctors; 4.3.1 Quadrupole-Octupole Corrector; 4.3.2 Hexapole Corrector; 4.3.3 Parasitic Aberrations; 4.4 Getting Around Chromatic Aberrations; 4.5 Diagnosing Lens Aberrations; 4.5.1 Image-based Methods; 4.5.2 Ronchigram-based Methods; 4.5.3 Precision Needed; 4.6 Fifth Order Aberration-Correction; 4.7 Conclusions 327 $a5 Theory and Simulations of STEM Imaging5.1 Introduction; 5.2 Z-Contrast Imaging of Single Atoms; 5.3 STEM Imaging Of Crystalline Materials; 5.3.1 Bright-field Imaging and Phase Contrast; 5.3.2 Annular Dark-field Imaging; 5.4 Incoherent Imaging with Dynamical Scattering; 5.5 Thermal Diffuse Scattering; 5.5.1 Approximations for Phonon Scattering; 5.6 Methods of Simulation for ADF Imaging; 5.6.1 Absorptive Potentials; 5.6.2 Frozen Phonon Approach; 5.7 Conclusions; 6 Details of STEM; 6.1 Signal to Noise Ratio and Some of its Implications 327 $a6.2 The Relationships Between Probe Size, Probe Current and Probe Angle6.2.1 The Geometric Model Revisited; 6.2.2 The Minimum Probe Size, the Optimum Angle and the Probe Current; 6.2.3 The Probe Current; 6.2.4 A Simple Approximation to Wave Optical Probe Size; 6.2.5 The Effect of Chromatic Aberration; 6.2.6 Choosing aopt in Practice; 6.2.7 The Effect of Making a Small Error in the Choice of aopt; 6.2.8 The Effect of a On the Diffraction Pattern; 6.2.9 Probe Spreading and Depth of Field; 6.3 The Condenser System; 6.4 The Scanning System; 6.4.1 Principles of the Scanning System 327 $a6.4.2 Implementation of the Scanning System 330 $a"The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS)"--$cProvided by publisher. 330 $a"The book will be concerned with the theory, background and practical use of transmission electron microscopes with lens correctors which can correct for the effects of spherical aberration"--$cProvided by publisher. 410 0$aRMS - Royal Microscopical Society 606 $aTransmission electron microscopy 606 $aAberration 606 $aAchromatism 615 0$aTransmission electron microscopy. 615 0$aAberration. 615 0$aAchromatism. 676 $a502.8/25 676 $a502.825 686 $aSCI053000$2bisacsh 701 $aBrydson$b Rik$01612811 701 $aBrooks$b Susan$01612812 712 02$aRoyal Microscopical Society (Great Britain) 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910822805803321 996 $aAberration-corrected analytical transmission electron microscopy$93941794 997 $aUNINA