LEADER 05508nam 2200697Ia 450 001 9910452298303321 005 20200520144314.0 010 $a1-299-46215-4 010 $a1-908977-13-2 035 $a(CKB)2550000001019206 035 $a(EBL)1168158 035 $a(OCoLC)841216098 035 $a(SSID)ssj0000907258 035 $a(PQKBManifestationID)11568767 035 $a(PQKBTitleCode)TC0000907258 035 $a(PQKBWorkID)10855811 035 $a(PQKB)11686328 035 $a(MiAaPQ)EBC1168158 035 $a(WSP)0000P883 035 $a(Au-PeEL)EBL1168158 035 $a(CaPaEBR)ebr10699296 035 $a(CaONFJC)MIL477465 035 $a(EXLCZ)992550000001019206 100 $a20130122d2013 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aHalf-metallic materials and their properties$b[electronic resource] /$fC.Y. Fong, J.E. Pask & L.H. Yang 210 $aLondon, UK $cImperial College Press ;$aSingapore $cDist. by World Scientific$d2013 215 $a1 online resource (304 p.) 225 1 $aMaterials for engineering ;$vv. 2 300 $aDescription based upon print version of record. 311 $a1-908977-12-4 320 $aIncludes bibliographical references and index. 327 $aAcknowledgments; Preface; Contents; 1. Introduction; 1.1 Background; 1.2 Classes of Half-metals; 1.3 Half-metallic Devices; 2. Methods of Studying Half-metals; 2.1 Introduction; 2.2 Molecular BeamEpitaxy (MBE); 2.2.1. Schematic setup; 2.2.2. Issues concerning growth; 2.2.2.1. Substrate for Heusler alloys; 2.2.2.2. Substrate for HMs with ZB structure; 2.2.2.3. Temperature; 2.3 Characterization of Samples; 2.3.1. Reflection high-energy electron diffraction (RHEED); 2.3.1.1. Basic information; 2.3.1.2. What is measured; 2.3.2. X-ray reflectometry (XRR); 2.3.2.1. Basic information 327 $a2.3.2.2. Schematic setup2.3.2.3. What is measured; 2.3.3. Scanning tunneling microscopy (STM); 2.3.3.1. Basic information; 2.3.3.2. What is measured; 2.3.4. Auger electron spectroscopy (AES); 2.3.4.1. Basic processes; 2.3.4.2. Simplified experimental setup; 2.3.4.3. What is measured; 2.3.4.4. Remarks; 2.4 Methods of Determining Physical Properties; 2.4.1. Magnetic properties; 2.4.1.1. SQUID-based magnetometer; 2.4.1.2. Magneto-optical Kerr effect (MOKE); 2.4.1.3. X-ray magnetic circular dichroism (XMCD); 2.4.2. Transport properties; 2.4.2.1. Magnetic tunnel junctions (MTJs) 327 $a2.4.2.2. Resistivity2.4.2.3. Hall conductivity; 2.4.3. Half-metallic properties; 2.4.3.1. Spin-polarized angle-resolved photoemission spectroscopy (ARPES); 2.4.3.2. Ferromagnet-superconductor tunneling; 2.4.3.3. Andreev reflection; 2.4.3.4. Curie temperature TC; 2.5 TheoreticalMethods; 2.5.1. Density functional theory (DFT); 2.5.1.1. Hohenberg-Kohn theorem I; 2.5.1.2. Hohenberg-Kohn theorem II; 2.5.2. Kohn-Sham equations; 2.5.2.1. Local density approximation (LDA); 2.5.2.2. Spin-polarized Kohn-Sham equations; 2.5.2.3. Generalized gradient approximation (GGA) 327 $a2.5.3. Methods of calculating electronic properties2.5.3.1. Linearized augmented plane wave (LAPW) method; 2.5.3.2. Korringa-Kohn-Rostoker (KKR) method; 2.5.3.3. Pseudopotential method; 2.5.3.4. LDA+U; 2.5.4. Methods of calculating Curie temperature TC; 2.5.4.1. Determination of the dominant excitation; 2.5.4.2. Basic idea; 2.5.4.3. Comments on practical calculations; 3. Heusler Alloys; 3.1 Introduction; 3.2 Half-Heusler and Full-Heusler Alloys; 3.3 Methods of Growing Heusler Alloys; 3.3.1. Bulk Heusler alloys; 3.3.1.1. Arc-melting method; 3.3.1.2. Tri-arc Czochralski method 327 $a3.3.2. Thin films3.3.2.1. MBE method; 3.3.2.2. Radio frequency magnetron sputtering method; 3.3.2.3. Pulsed laser deposition (PLD); 3.4 Characterization of Heusler Alloys; 3.4.1. Bulk Heusler alloys; 3.4.2. Thin films; 3.4.2.1. Auger electron spectroscopy (AES); 3.4.2.2. Low-energy electron diffraction (LEED); 3.5 Physical Properties of Bulk Heusler Alloys; 3.5.1. Magnetic moments and the Slater-Pauling rule; 3.5.2. Insulating gap in half-metallic Heusler alloys; 3.5.2.1. Half-Heusler alloys; 3.5.2.2. Full-Heusler alloys; 3.5.3. Polarization at EF; 3.5.4. Magnetic moments 327 $a3.5.5. Curie temperature TC 330 $aThis volume provides a detailed treatment of half-metallic materials and their properties from both an experimental and theoretical point of view. It discusses the methods used to understand and predict the properties of half-metals and the gamut of other materials amenable to these techniques. It also offers an expansive bibliography to facilitate further and deeper research. This book provides the precise definitions of all key terminology used in the vast and varied literature.This is the first comprehensive monograph on the subject and will serve as a starting point for graduate students a 410 0$aSeries on materials for engineering ;$vv. 2. 606 $aMetallic composites 606 $aMetals 608 $aElectronic books. 615 0$aMetallic composites. 615 0$aMetals. 676 $a620 676 $a620.16 700 $aFong$b C. Y$g(Ching-yao)$0975811 701 $aPask$b J. E$0975812 701 $aYang$b L. H$0975813 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910452298303321 996 $aHalf-metallic materials and their properties$92222073 997 $aUNINA