LEADER 02343nam 2200649 a 450 001 9910451546503321 005 20200520144314.0 010 $a1-4129-0015-8 010 $a1-4462-3987-X 010 $a1-281-25154-2 010 $a9786611251543 010 $a1-84787-768-0 035 $a(CKB)1000000000410079 035 $a(EBL)714282 035 $a(OCoLC)437202989 035 $a(SSID)ssj0000266292 035 $a(PQKBManifestationID)11214743 035 $a(PQKBTitleCode)TC0000266292 035 $a(PQKBWorkID)10305244 035 $a(PQKB)11598705 035 $a(MiAaPQ)EBC714282 035 $a(OCoLC)290532572 035 $a(StDuBDS)EDZ0000067635 035 $a(Au-PeEL)EBL714282 035 $a(CaPaEBR)ebr10218170 035 $a(CaONFJC)MIL125154 035 $a(EXLCZ)991000000000410079 100 $a20120405d2005 fy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aUsing thinking skills in the primary classroom$b[electronic resource] /$fPeter Kelly 210 $aLondon $cPaul Chapman$d2005 215 $a1 online resource (113 p.) 300 $aDescription based upon print version of record. 311 $a1-4462-1135-5 311 $a1-4129-0016-6 320 $aIncludes bibliographical references and index. 327 $aCover; Contents; Acknowledgements; Biographical Details; Figures; Tasks; Introduction; Chapter 1; Chapter 2; Chapter 3; Chapter 4; Chapter 5; Chapter 6; Notes; Index 330 8 $aWorking with the sound thinking skills that children already display as part of their learning, this text takes a practical approach to getting the best out of them. As well as explaining this concept, there are lots of practical suggestions and examples for lessons and activities. 606 $aEducational psychology 606 $aCognition in children 606 $aElementary school teaching 608 $aElectronic books. 615 0$aEducational psychology. 615 0$aCognition in children. 615 0$aElementary school teaching. 676 $a372.1102 700 $aKelly$b Peter$f1929-$01055931 801 0$bStDuBDS 801 1$bStDuBDS 906 $aBOOK 912 $a9910451546503321 996 $aUsing thinking skills in the primary classroom$92489769 997 $aUNINA LEADER 01861oam 2200481zu 450 001 9910872846103321 005 20241212214914.0 035 $a(CKB)111026746720556 035 $a(SSID)ssj0000454958 035 $a(PQKBManifestationID)12175359 035 $a(PQKBTitleCode)TC0000454958 035 $a(PQKBWorkID)10399245 035 $a(PQKB)11207244 035 $a(EXLCZ)99111026746720556 100 $a20160829d1997 uy 101 0 $aeng 181 $ctxt 182 $cc 183 $acr 200 10$a1997 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997 210 31$a[Place of publication not identified]$cIEEE Electron Devices Society$d1997 300 $aBibliographic Level Mode of Issuance: Monograph 311 08$a9780780342057 311 08$a0780342054 606 $aIntegrated circuits$xReliability$xCongresses 606 $aIntegrated circuits$xCongresses$xReliability$xWafer-scale integration 606 $aElectrical & Computer Engineering$2HILCC 606 $aElectrical Engineering$2HILCC 606 $aEngineering & Applied Sciences$2HILCC 615 0$aIntegrated circuits$xReliability$xCongresses. 615 0$aIntegrated circuits$xCongresses$xReliability$xWafer-scale integration. 615 7$aElectrical & Computer Engineering 615 7$aElectrical Engineering 615 7$aEngineering & Applied Sciences 676 $a621.3815 712 02$aIEEE Reliability Society 712 02$aIEEE Electron Devices Society 712 12$aInternational Integrated Reliability Workshop 801 0$bPQKB 906 $aBOOK 912 $a9910872846103321 996 $a1997 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997$92539629 997 $aUNINA