LEADER 02546nam  2200517Ia 450 
001 9910450730603321
005 20200520144314.0
010   $a1-280-73763-8
010   $a9786610737635
010   $a1-84663-195-5
024 3 $z9781846631948
035   $a(CKB)1000000000337370
035   $a(EBL)285510
035   $a(OCoLC)99784561
035   $a(MiAaPQ)EBC285510
035   $a(Au-PeEL)EBL285510
035   $a(CaPaEBR)ebr10156460
035   $a(CaONFJC)MIL73763
035   $a(EXLCZ)991000000000337370
100   $a20000815d2006      uy             0
101 0 $aeng
135   $aur|n|---|||||
200 00$aAdvanced reliability modeling$b[electronic resource] $epart II /$fguest editors: Tadashi Dohi, Naoto Kaio and Won Young Yun
210   $aBradford, England $cEmerald Group Publishing$dc2006
215   $a1 online resource (101 p.)
225 0 $aJournal of Quality in Maintenance Engineering ;$v12, no. 4
300   $aDescription based upon print version of record.
311   $a1-84663-194-7 
327   $aCover; CONTENTS; EDITORIAL ADVISORY BOARD; Editorial; Genetic search for redundancy optimization in complex systems; Reliability-redundancy optimization using simulated annealing algorithms; Calculating top event probability of a fault tree with many repeated events; Acceptance sampling plans based on failure-censored step-stress accelerated tests for Weibull distributions; Reliability design of industrial plants using Petri nets; Stochastic performance evaluation for multi-task processing system with software availability model
327   $aSoftware reliability modeling in distributed development environment
330   $aThis e-book contains selected papers invited/presented in the Asian International Workshop on Advanced Reliability Modeling (AIWARM) which was held in Hiroshima, Japan, August 26-27, 2004. This e-book is intended to share the ideas and results from the workshop with more reliability researchers and practitioners.
606   $aReliability (Engineering)$xMathematical models
606   $aComputer networks$xReliability
608   $aElectronic books.
615  0$aReliability (Engineering)$xMathematical models.
615  0$aComputer networks$xReliability.
701   $aDohi$b Tadashi$0891164
701   $aKaio$b Naoto$0964383
701   $aYun$b Won Young$0915847
801  0$bMiAaPQ
801  1$bMiAaPQ
801  2$bMiAaPQ
906   $aBOOK
912   $a9910450730603321
996   $aAdvanced reliability modeling$92187513
997   $aUNINA