LEADER 01639nam 2200421 450 001 9910440128803321 005 20231206173724.0 010 $a0-7381-0826-X 024 70$a10.1109/IEEESTD.1988.6746635 035 $a(CKB)3780000000089137 035 $a(NjHacI)993780000000089137 035 $a(EXLCZ)993780000000089137 100 $a20231206d1988 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aANSI/IEEE Std 101-1987 $eIEEE Guide for the Statistical Analysis of Thermal Life Test Data /$fIEEE 210 1$aPiscataway :$cIEEE,$d1988. 215 $a1 online resource (34 pages) 330 $aStatistical analyses of data from thermally accelerated aging tests are described. The basis and use of statistical calculations are explained. Data analysis, estimation of the relationship between life and temperature, and the comparison between two sets of data are covered. 517 $aANSI/IEEE Std 101-1987: IEEE Guide for the Statistical Analysis of Thermal Life Test Data 606 $aElectric insulators and insulation$xTesting 606 $aThermal stresses 606 $aThermal analysis 606 $aElectric insulators and insulation$xStandards 615 0$aElectric insulators and insulation$xTesting. 615 0$aThermal stresses. 615 0$aThermal analysis. 615 0$aElectric insulators and insulation$xStandards. 676 $a621.31937 801 0$bNjHacI 801 1$bNjHacl 906 $aDOCUMENT 912 $a9910440128803321 996 $aANSI$92072434 997 $aUNINA