LEADER 03203nam 2200529Ia 450 001 9910438039203321 005 20200520144314.0 010 $a1-299-19739-6 010 $a1-4614-6163-4 024 7 $a10.1007/978-1-4614-6163-0 035 $a(OCoLC)824738231 035 $a(MiFhGG)GVRL6WAC 035 $a(CKB)2560000000100047 035 $a(MiAaPQ)EBC1106143 035 $a(EXLCZ)992560000000100047 100 $a20130122d2013 uy 0 101 0 $aeng 135 $aurun|---uuuua 181 $ctxt 182 $cc 183 $acr 200 10$aAnalog IC reliability in nanometer CMOS /$fElie Maricau, Georges Gielen 205 $a1st ed. 2013. 210 $aNew York, NY $cSpringer Science$dc2013 215 $a1 online resource (xvi, 198 pages) $cillustrations (some color) 225 0 $aAnalog circuits and signal processing 300 $aDescription based upon print version of record. 311 $a1-4899-8630-8 311 $a1-4614-6162-6 320 $aIncludes bibliographical references and index. 327 $aIntroduction -- CMOS Reliability Overview -- Transistor Aging Compact Modeling -- Background on IC Reliability Simulation -- Analog IC Reliability Simulation -- Integrated Circuit Reliability -- Conclusions. 330 $aThis book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed.   The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.   ·         Enables readers to understand long-term reliability of an integrated circuit; ·         Reviews CMOS unreliability effects, with focus on those that will emerge in future CMOS nodes; ·         Provides overview of models for key aging effects, as well as compact models that can be included in a circuit simulator, with model parameters for advanced CMOS technology; ·         Describes existing reliability simulators, along with techniques to analyze the impact of process variations and aging on an arbitrary analog circuit. 410 0$aAnalog circuits and signal processing series. 606 $aLinear integrated circuits$xReliability 606 $aMetal oxide semiconductors, Complementary 615 0$aLinear integrated circuits$xReliability. 615 0$aMetal oxide semiconductors, Complementary. 676 $a621.3815 700 $aMaricau$b Elie$01060667 701 $aGielen$b Georges$0720975 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910438039203321 996 $aAnalog IC reliability in nanometer CMOS$94197425 997 $aUNINA