LEADER 04016nam 22007815 450 001 9910437909903321 005 20200703173154.0 010 $a1-283-94626-2 010 $a3-642-31229-2 024 7 $a10.1007/978-3-642-31229-8 035 $a(CKB)2670000000533136 035 $a(EBL)1030564 035 $a(OCoLC)823745649 035 $a(SSID)ssj0000879047 035 $a(PQKBManifestationID)11540458 035 $a(PQKBTitleCode)TC0000879047 035 $a(PQKBWorkID)10837465 035 $a(PQKB)10945362 035 $a(DE-He213)978-3-642-31229-8 035 $a(MiAaPQ)EBC1030564 035 $a(PPN)168318873 035 $a(EXLCZ)992670000000533136 100 $a20121227d2013 u| 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aHigh-Performance D/A-Converters$b[electronic resource] $eApplication to Digital Transceivers /$fby Martin Clara 205 $a1st ed. 2013. 210 1$aBerlin, Heidelberg :$cSpringer Berlin Heidelberg :$cImprint: Springer,$d2013. 215 $a1 online resource (296 p.) 225 1 $aSpringer Series in Advanced Microelectronics,$x1437-0387 ;$v36 300 $aDescription based upon print version of record. 311 $a3-642-31228-4 311 $a3-642-43275-1 320 $aIncludes bibliographical references and index. 327 $aPerformance Figures of D/A-Converters -- Static Linearity -- Dynamic Linearity -- Noise-shaped D/A-Converters -- Advanced Current Calibration. 330 $aThis book deals with modeling and implementation of high performance, current-steering D/A-converters for digital transceivers in nanometer CMOS technology. In the first part, the fundamental performance limitations of current-steering DACs are discussed. Based on simplified models, closed-form expressions for a number of basic non-ideal effects are derived and tested.  With the knowledge of basic performance limits, the converter and system architecture can be optimized in an early design phase, trading off circuit complexity, silicon area and power dissipation for static and dynamic performance. The second part describes four different current-steering DAC designs in standard 130 nm CMOS. The converters have a resolution in the range of 12-14 bits for an analog bandwidth between 2.2 MHz and 50 MHz and sampling rates from 100 MHz to 350 MHz. Dynamic-Element-Matching (DEM) and advanced dynamic current calibration techniques are employed to minimize the required silicon area. 410 0$aSpringer Series in Advanced Microelectronics,$x1437-0387 ;$v36 606 $aSignal processing 606 $aImage processing 606 $aSpeech processing systems 606 $aElectronics 606 $aMicroelectronics 606 $aSemiconductors 606 $aElectronic circuits 606 $aSignal, Image and Speech Processing$3https://scigraph.springernature.com/ontologies/product-market-codes/T24051 606 $aElectronics and Microelectronics, Instrumentation$3https://scigraph.springernature.com/ontologies/product-market-codes/T24027 606 $aSemiconductors$3https://scigraph.springernature.com/ontologies/product-market-codes/P25150 606 $aElectronic Circuits and Devices$3https://scigraph.springernature.com/ontologies/product-market-codes/P31010 615 0$aSignal processing. 615 0$aImage processing. 615 0$aSpeech processing systems. 615 0$aElectronics. 615 0$aMicroelectronics. 615 0$aSemiconductors. 615 0$aElectronic circuits. 615 14$aSignal, Image and Speech Processing. 615 24$aElectronics and Microelectronics, Instrumentation. 615 24$aSemiconductors. 615 24$aElectronic Circuits and Devices. 676 $a621.38159 700 $aClara$b Martin$4aut$4http://id.loc.gov/vocabulary/relators/aut$01059130 906 $aBOOK 912 $a9910437909903321 996 $aHigh-Performance D$92504247 997 $aUNINA