LEADER 03581nam 2200541 a 450 001 9910437901603321 005 20200520144314.0 010 $a1-283-69704-1 010 $a1-4614-2269-8 024 7 $a10.1007/978-1-4614-2269-3 035 $a(CKB)2670000000277553 035 $a(EBL)1030868 035 $a(OCoLC)813298568 035 $a(SSID)ssj0000767224 035 $a(PQKBManifestationID)11445977 035 $a(PQKBTitleCode)TC0000767224 035 $a(PQKBWorkID)10740689 035 $a(PQKB)11355251 035 $a(DE-He213)978-1-4614-2269-3 035 $a(MiAaPQ)EBC1030868 035 $a(PPN)168296063 035 $a(EXLCZ)992670000000277553 100 $a20120710d2012 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aVariation-aware design of custom integrated circuits $ea hands-on field guide /$fTrent McConaghy ... [et al.] ; with a foreword by James P. Hogan 210 $aNew York $cSpringer$d2012 215 $a1 online resource (197 p.) 300 $aDescription based upon print version of record. 311 $a1-4614-2268-X 320 $aIncludes bibliographical references. 327 $aIntroduction -- Fast PTV Verification and Design -- Pictoral Primer on Probablilities -- 3-Sigma Verification and Design -- High-Sigma Verification and Design -- Variation-Aware Design -- Conclusion. 330 $aThis book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects.  The authors have created a field guide to show how to handle variation proactively, and to understand the benefits of doing so. Readers facing variation challenges in their memory, standard cell, analog/RF, and custom digital designs will find easy-to-read, pragmatic solutions.   Reviews the most important concepts in variation-aware design, including types of variables and variation, useful variation-aware design terminology, and an overview and comparison of high-level design flows. Describes and compares a suite of approaches and flows for PVT corner-driven design and verification. Presents Fast PVT, a novel, confidence-driven global optimization technique for PVT corner extraction and verification that is both rapid and reliable. Presents a visually-oriented overview of probability density functions, Monte Carlo sampling, and yield estimation. Describes a suite of methods used for 2-3 sigma statistical design and presents a novel sigma-driven corners flow, which is a fast, accurate, and scalable method suitable for 2-3 sigma design and verification. Describes and compares high-sigma design and verification techniques and presents a novel technique for high-sigma statistical corner extraction and verification, demonstrating its fast, accurate, scalable, and verifiable qualities across a variety of applications. Compares manual design and automated sizing and introduces an integrated approach to aid the sizing step in PVT, 3? statistical and high-sigma statistical design. 606 $aIntegrated circuits$vHandbooks, manuals, etc 615 0$aIntegrated circuits 676 $a621.3815 700 $aMcConaghy$b Trent$01059607 701 $aHogan$b James P$0219473 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910437901603321 996 $aVariation-aware design of custom integrated circuits$92507345 997 $aUNINA