LEADER 01745nam 2200337 450 001 9910437340403321 005 20230415023703.0 010 $a1-7281-4892-8 035 $a(CKB)5410000000003477 035 $a(NjHacI)995410000000003477 035 $a(EXLCZ)995410000000003477 100 $a20230415d2020 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$a2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT /$fInstitute of Electrical and Electronics Engineers 210 1$a[Place of publication not identified] :$cInstitute of Electrical and Electronics Engineers,$d2020. 215 $a1 online resource 311 $a1-7281-4893-6 330 $aMetroInd4 0&IoT aims to discuss the contributions both of the metrology for the development of Industry 4 0 and IoT and the new opportunities offered by Industry 4 0 and IoT for the development of new measurement methods and apparatus MetroInd4 0&IoT aims to gather people who work in developing instrumentation and measurement methods for Industry 4 0 and IoT Attention is paid, but not limited to, new technology for metrology assisted production in Industry 4 0 and IoT, Industry 4 0 and IoT component measurement, sensors and associated signal conditioning for Industry 4 0 and IoT, and calibration methods for electronic test and measurement for Industry 4 0 and IoT. 606 $aMetrology$vCongresses 615 0$aMetrology 676 $a389.1 801 0$bNjHacI 801 1$bNjHacl 906 $aPROCEEDING 912 $a9910437340403321 996 $a2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT$92500849 997 $aUNINA