LEADER 01381nam 2200397 450 001 9910412078403321 005 20230827080415.0 035 $a(CKB)5280000000243196 035 $a(NjHacI)995280000000243196 035 $a(EXLCZ)995280000000243196 100 $a20230827d2020 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aProceedings of the 2020 CHI Conference on Human Factors in Computing Systems /$fRegina Bernhaupt [and three others] ; Association for Computing Machinery, issuing body 210 1$aNew York, NY :$cAssociation for Computing Machinery,$d2020. 210 4$dİ2020 215 $a1 online resource 311 $a1-4503-6708-9 606 $aComputer software$xHuman factors 606 $aHuman-computer interaction 606 $aUser interfaces (Computer systems) 615 0$aComputer software$xHuman factors. 615 0$aHuman-computer interaction. 615 0$aUser interfaces (Computer systems) 676 $a004.019 700 $aBernhaupt$b Regina$01396314 712 02$aAssociation for Computing Machinery, 801 0$bNjHacI 801 1$bNjHacl 906 $aBOOK 912 $a9910412078403321 996 $aProceedings of the 2020 CHI Conference on Human Factors in Computing Systems$93456233 997 $aUNINA LEADER 01562aam 2200409I 450 001 9910710590703321 005 20231117235049.0 024 8 $aGOVPUB-C13-816035d34a70cf1c8553e463d2b4cfee 035 $a(CKB)5470000002477386 035 $a(OCoLC)947843700 035 $a(EXLCZ)995470000002477386 100 $a20160426d1984 ua 0 101 0 $aeng 181 $2rdacontent 182 $2rdamedia 183 $2rdacarrier 200 10$aMeasurement techniques for high-power semiconductor materials and devices $eannual report, January 1, 1982 to March 31, 1983 /$fW. R. Thurber; J. R. Lowney; W. E. Phillips 210 1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d1984. 215 $a1 online resource 225 1 $aNBSIR ;$v84-2838 300 $a1984. 300 $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes. 300 $aTitle from PDF title page. 320 $aIncludes bibliographical references. 517 $aMeasurement techniques for high-power semiconductor materials and devices 700 $aThurber$b W. Robert$01390342 701 $aLowney$b J. R$01390343 701 $aPhillips$b W. E$01390344 701 $aThurber$b W. Robert$01390342 712 02$aUnited States.$bNational Bureau of Standards. 801 0$bNBS 801 1$bNBS 801 2$bGPO 906 $aBOOK 912 $a9910710590703321 996 $aMeasurement techniques for high-power semiconductor materials and devices$93442947 997 $aUNINA