LEADER 03013nam 2200577Ia 450 001 9910403761403321 005 20210813230250.0 010 $a1-4665-0347-5 035 $a(CKB)2670000000316832 035 $a(EBL)1107603 035 $a(OCoLC)823719605 035 $a(SSID)ssj0000803732 035 $a(PQKBManifestationID)11488888 035 $a(PQKBTitleCode)TC0000803732 035 $a(PQKBWorkID)10811509 035 $a(PQKB)11684281 035 $a(MiAaPQ)EBC1107603 035 $a(CaSebORM)9781466503472 035 $a(EXLCZ)992670000000316832 100 $a20120920d2013 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aStrain-engineered MOSFETs /$fC. K. Maiti, T. K. Maiti 205 $a1st edition 210 $aBoca Raton $cTaylor & Francis$dc2013 215 $a1 online resource (311 p.) 300 $aDescription based upon print version of record. 311 $a1-4665-0055-7 320 $aIncludes bibliographical references and index. 327 $aFront Cover; Contents; Preface; About the Authors; List of Abbreviations; List of Symbols; Chapter 1 - Introduction; Chapter 2 - Substrate-Induced Strain Engineering in CMOS Technology; Chapter 3 - Process-Induced Stress Engineering in CMOS Technology; Chapter 4 - Electronic Properties of Strain-Engineered Semiconductors; Chapter 5 - Strain-Engineered MOSFETs; Chapter 6 - Noise in Strain-Engineered Devices; Chapter 7 - Technology CAD of Strain-Engineered MOSFETs; Chapter 8 - Reliability and Degradation of Strain-Engineered MOSFETs 327 $aChapter 9 - Process Compact Modelling of Strain-Engineered MOSFETsChapter 10 - Process-Aware Design of Strain-Engineered MOSFETs; Chapter 11 - Conclusions; Back Cover 330 $aCurrently strain engineering is the main technique used to enhance the performance of advanced silicon-based metal-oxide-semiconductor field-effect transistors (MOSFETs). Written from an engineering application standpoint, Strain-Engineered MOSFETs introduces promising strain techniques to fabricate strain-engineered MOSFETs and to methods to assess the applications of these techniques. The book provides the background and physical insight needed to understand new and future developments in the modeling and design of n- and p-MOSFETs at nanoscale. This book fo 606 $aIntegrated circuits$xFault tolerance 606 $aMetal oxide semiconductor field-effect transistors$xReliability 606 $aStrains and stresses 608 $aElectronic books. 615 0$aIntegrated circuits$xFault tolerance. 615 0$aMetal oxide semiconductor field-effect transistors$xReliability. 615 0$aStrains and stresses. 676 $a621.3815/284 676 $a621.3815284 700 $aMaiti$b C. K$0866187 701 $aMaiti$b T. K$0866188 801 0$bMiAaPQ 906 $aBOOK 912 $a9910403761403321 996 $aStrain-engineered MOSFETs$91933236 997 $aUNINA