LEADER 01249nam 2200373 450 001 9910389526003321 005 20230615215942.0 010 $a1-7281-5025-6 024 7 $a10.1109/MTV48867.2019 035 $a(CKB)5280000000206992 035 $a(NjHacI)995280000000206992 035 $a(EXLCZ)995280000000206992 100 $a20230615d2019 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$a2019 20th International Workshop on Microprocessor/SoC Test, Security and Verification (MTV) /$fInstitute of Electrical and Electronics Engineers 210 1$aPiscataway, NJ :$cIEEE,$d2019. 210 4$dİ2019 215 $a1 online resource (192 pages) 311 $a1-7281-5026-4 320 $aIncludes bibliographical references and index. 517 $a2019 20th International Workshop on Microprocessor/SoC Test, Security and Verification 606 $aMicroprocessors$vCongresses 615 0$aMicroprocessors 676 $a001.6404 801 0$bNjHacI 801 1$bNjHacl 906 $aPROCEEDING 912 $a9910389526003321 996 $a2019 20th International Workshop on Microprocessor$92525989 997 $aUNINA