LEADER 01817oam 2200505zu 450 001 9910376395003321 005 20210807002216.0 035 $a(CKB)3170000000003415 035 $a(SSID)ssj0001138158 035 $a(PQKBManifestationID)11652728 035 $a(PQKBTitleCode)TC0001138158 035 $a(PQKBWorkID)11131311 035 $a(PQKB)10282503 035 $a(WaSeSS)IndRDA00016147 035 $a(Association for Computing Machinery)10.1145/1292414 035 $a(EXLCZ)993170000000003415 100 $a20160829d2007 uy 101 0 $aeng 135 $aur||||||||||| 181 $ctxt 182 $cc 183 $acr 200 00$aProceedings of the second International Workshop on Random Testing (RT 2007) : Atlanta, Georgia, USA, November 6, 2007 210 31$a[Place of publication not identified]$cACM$d2007 215 $a1 online resource (48 pages) 225 1 $aACM Conferences 300 $aBibliographic Level Mode of Issuance: Monograph 311 $a1-59593-881-8 410 0$aACM Conferences 517 1 $aProceedings of the 2nd International Workshop on Random Testing 517 1 $aRT 2007 606 $aEngineering & Applied Sciences$2HILCC 606 $aComputer Science$2HILCC 615 7$aEngineering & Applied Sciences 615 7$aComputer Science 702 $aGaudel$b M.-C 702 $aMayer$b Johannes 702 $aMerkel$b Robert G 712 02$aAssociation for Computing Machinery-Digital Library. 712 12$aIEEE/ACM International Conference on Automated Software Engineering$d(22nd :$f2007 :$eAtlanta, Ga.) 801 0$bPQKB 906 $aBOOK 912 $a9910376395003321 996 $aProceedings of the second International Workshop on Random Testing (RT 2007) : Atlanta, Georgia, USA, November 6, 2007$92076537 997 $aUNINA