LEADER 03808nam  22007095  450 
001 9910373886003321
005 20200706141622.0
010   $a981-15-2217-0
024 7 $a10.1007/978-981-15-2217-8
035   $a(CKB)4900000000505269
035   $a(DE-He213)978-981-15-2217-8
035   $a(MiAaPQ)EBC6011705
035   $a(PPN)242843662
035   $a(EXLCZ)994900000000505269
100   $a20200107d2020      u|         0
101 0 $aeng
135   $aurnn#008mamaa
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aThermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory /$fby Rui Lan
205   $a1st ed. 2020.
210  1$aSingapore :$cSpringer Singapore :$cImprint: Springer,$d2020.
215   $a1 online resource (XI, 139 p. 120 illus., 64 illus. in color.)
311   $a981-15-2216-2 
327   $aIntroduction  -- Establishment of the hot strip method for thermal conductivity meausurements of Ge-Sb-Te alloys -- Thermal conductivities of Ge-Sb-Te alloys -- Electrical resistivities of Ge-Sb-Te alloys -- Thermal conduction mechanisms and prediction equations of thermal conductivity for Ge-Sb-Te alloys -- Densities of Ge-Sb-Te alloys -- Summary and conclusions. .
330   $aThis book focuses on the thermophysical properties of Ge-Sb-Te alloys, which are the most widely used phase change materials, and the technique for measuring them. Describing the measuring procedure and parameter calibration in detail, it provides readers with an accurate method for determining the thermophysical properties of phase change materials and other related materials. Further, it discusses combining thermal and electrical conductivity data to analyze the conduction mechanism, allowing readers to gain an understanding of phase change materials and PCM industry simulation.
606   $aMaterials science
606   $aOptical materials
606   $aElectronic materials
606   $aSemiconductors
606   $aEngineering?Materials
606   $aElectronic circuits
606   $aPhase transitions (Statistical physics)
606   $aCharacterization and Evaluation of Materials$3https://scigraph.springernature.com/ontologies/product-market-codes/Z17000
606   $aOptical and Electronic Materials$3https://scigraph.springernature.com/ontologies/product-market-codes/Z12000
606   $aSemiconductors$3https://scigraph.springernature.com/ontologies/product-market-codes/P25150
606   $aMaterials Engineering$3https://scigraph.springernature.com/ontologies/product-market-codes/T28000
606   $aElectronic Circuits and Devices$3https://scigraph.springernature.com/ontologies/product-market-codes/P31010
606   $aPhase Transitions and Multiphase Systems$3https://scigraph.springernature.com/ontologies/product-market-codes/P25099
615  0$aMaterials science.
615  0$aOptical materials.
615  0$aElectronic materials.
615  0$aSemiconductors.
615  0$aEngineering?Materials.
615  0$aElectronic circuits.
615  0$aPhase transitions (Statistical physics).
615 14$aCharacterization and Evaluation of Materials.
615 24$aOptical and Electronic Materials.
615 24$aSemiconductors.
615 24$aMaterials Engineering.
615 24$aElectronic Circuits and Devices.
615 24$aPhase Transitions and Multiphase Systems.
676   $a660.2977
700   $aLan$b Rui$4aut$4http://id.loc.gov/vocabulary/relators/aut$01063925
801  0$bMiAaPQ
801  1$bMiAaPQ
801  2$bMiAaPQ
906   $aBOOK
912   $a9910373886003321
996   $aThermophysical Properties and Measuring Technique of Ge-Sb-Te Alloys for Phase Change Memory$92535290
997   $aUNINA