LEADER 04850nam 2201249z- 450 001 9910367565203321 005 20231214133708.0 010 $a3-03921-280-X 035 $a(CKB)4100000010106094 035 $a(oapen)https://directory.doabooks.org/handle/20.500.12854/57568 035 $a(EXLCZ)994100000010106094 100 $a20202102d2019 |y 0 101 0 $aeng 135 $aurmn|---annan 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aRadiation Tolerant Electronics 210 $cMDPI - Multidisciplinary Digital Publishing Institute$d2019 215 $a1 electronic resource (210 p.) 311 $a3-03921-279-6 330 $aResearch on radiation-tolerant electronics has increased rapidly over the past few years, resulting in many interesting approaches to modeling radiation effects and designing radiation-hardened integrated circuits and embedded systems. This research is strongly driven by the growing need for radiation-hardened electronics for space applications, high-energy physics experiments such as those on the Large Hadron Collider at CERN, and many terrestrial nuclear applications including nuclear energy and nuclear safety. With the progressive scaling of integrated circuit technologies and the growing complexity of electronic systems, their susceptibility to ionizing radiation has raised many exciting challenges, which are expected to drive research in the coming decade. In this book we highlight recent breakthroughs in the study of radiation effects in advanced semiconductor devices, as well as in high-performance analog, mixed signal, RF, and digital integrated circuits. We also focus on advances in embedded radiation hardening in both FPGA and microcontroller systems and apply radiation-hardened embedded systems for cryptography and image processing, targeting space applications. 610 $asingle event effects 610 $aradiation-hardening-by-design (RHBD) 610 $afrequency divider by two 610 $asingle event upset 610 $aImage processing 610 $aCMOS analog integrated circuits 610 $aFPGA 610 $atotal ionizing dose (TID) 610 $aImpulse Sensitive Function 610 $asoft error 610 $ahardening by design 610 $aradiation hardening by design 610 $aX-rays 610 $aSingle-Event Upsets (SEUs) 610 $aline buffer 610 $aheavy ions 610 $aVHDL 610 $aFPGA-based digital controller 610 $aradiation hardening by design (RHBD) 610 $aradiation hardening 610 $aSRAM-based FPGA 610 $aproton irradiation 610 $aring oscillator 610 $asensor readout IC 610 $afault tolerance 610 $aspace application 610 $aphysical unclonable function 610 $avoltage controlled oscillator (VCO) 610 $aRing Oscillators 610 $aanalog single-event transient (ASET) 610 $asingle event opset (SEU) 610 $aSEB 610 $asingle event upsets 610 $abipolar transistor 610 $atotal ionizing dose 610 $aprotons 610 $atriple modular redundancy (TMR) 610 $again degradation 610 $aspace electronics 610 $asaturation effect 610 $aconfiguration memory 610 $aCo-60 gamma radiation 610 $atotal ionization dose (TID) 610 $afrequency synthesizers 610 $aCMOS 610 $aPLL 610 $aTDC 610 $asingle-event upsets (SEUs) 610 $abandgap voltage reference (BGR) 610 $a4MR 610 $asingle-shot 610 $aerror rates 610 $aRadiation Hardening by Design 610 $asoft errors 610 $aheavy-ions 610 $asingle-event effects (SEE) 610 $asingle event transient (SET) 610 $aSEE testing 610 $aproton irradiation effects 610 $aRFIC 610 $asingle event upset (SEU) 610 $aFMR 610 $aionization 610 $aradiation tolerant 610 $atriplex-duplex 610 $aneutron irradiation effects 610 $adigital integrated circuits 610 $asingle event gate rupture (SEGR) 610 $apower MOSFETs 610 $aring-oscillator 610 $aselective hardening 610 $avoltage reference 610 $anuclear fusion 610 $aTMR 610 $agamma-rays 610 $agamma ray 610 $ainstrumentation amplifier 610 $aradiation effects 610 $areference circuits 610 $aradiation-hardened 700 $aLeroux$b Paul$4auth$0720924 906 $aBOOK 912 $a9910367565203321 996 $aRadiation Tolerant Electronics$93024594 997 $aUNINA