LEADER 04515nam 22005775 450 001 9910360854203321 005 20251113203916.0 010 $a3-030-30726-3 024 7 $a10.1007/978-3-030-30726-4 035 $a(CKB)4100000009759122 035 $a(DE-He213)978-3-030-30726-4 035 $a(MiAaPQ)EBC5973824 035 $a(PPN)248602292 035 $a(MiAaPQ)EBC5973776 035 $a(EXLCZ)994100000009759122 100 $a20191106d2019 u| 0 101 0 $aeng 135 $aurnn#008mamaa 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aNanoelectronic Coupled Problems Solutions /$fedited by E. Jan W. ter Maten, Hans-Georg Brachtendorf, Roland Pulch, Wim Schoenmaker, Herbert De Gersem 205 $a1st ed. 2019. 210 1$aCham :$cSpringer International Publishing :$cImprint: Springer,$d2019. 215 $a1 online resource (XXX, 587 p. 300 illus., 200 illus. in color.) 225 1 $aThe European Consortium for Mathematics in Industry,$x2946-1871 ;$v29 311 08$a3-030-30725-5 327 $aEquations, discretizations -- Time integration for coupled problems -- Uncertainty quantification -- Model order reduction -- Robustness, reliability, ageing -- Testcases and measurements. 330 $aDesigns in nanoelectronics often lead to challenging simulation problems and include strong feedback couplings. Industry demands provisions for variability in order to guarantee quality and yield. It also requires the incorporation of higher abstraction levels to allow for system simulation in order to shorten the design cycles, while at the same time preserving accuracy. The methods developed here promote a methodology for circuit-and-system-level modelling and simulation based on best practice rules, which are used to deal with coupled electromagnetic field-circuit-heat problems, as well as coupled electro-thermal-stress problems that emerge in nanoelectronic designs. This book covers: (1) advanced monolithic/multirate/co-simulation techniques, which are combined with envelope/wavelet approaches to create efficient and robust simulation techniques for strongly coupled systems that exploit the different dynamics of sub-systems within multiphysics problems, and which allow designers to predict reliability and ageing; (2) new generalized techniques in Uncertainty Quantification (UQ) for coupled problems to include a variability capability such that robust design and optimization, worst case analysis, and yield estimation with tiny failure probabilities are possible (including large deviations like 6-sigma); (3) enhanced sparse, parametric Model Order Reduction techniques with a posteriori error estimation for coupled problems and for UQ to reduce the complexity of the sub-systems while ensuring that the operational and coupling parameters can still be varied and that the reduced models offer higher abstraction levels that can be efficiently simulated. All the new algorithms produced were implemented, transferred and tested by the EDA vendor MAGWEL. Validation was conducted on industrial designs provided by end-users from the semiconductor industry, who shared their feedback, contributed to the measurements, and supplied both material data and process data. In closing, a thorough comparison to measurements on real devices was made in order to demonstrate the algorithms? industrial applicability. 410 0$aThe European Consortium for Mathematics in Industry,$x2946-1871 ;$v29 606 $aMathematical models 606 $aMathematical optimization 606 $aMathematical Modeling and Industrial Mathematics 606 $aContinuous Optimization 615 0$aMathematical models. 615 0$aMathematical optimization. 615 14$aMathematical Modeling and Industrial Mathematics. 615 24$aContinuous Optimization. 676 $a003.3 702 $ater Maten$b E. Jan W$4edt$4http://id.loc.gov/vocabulary/relators/edt 702 $aBrachtendorf$b Hans-Georg$4edt$4http://id.loc.gov/vocabulary/relators/edt 702 $aPulch$b Roland$4edt$4http://id.loc.gov/vocabulary/relators/edt 702 $aSchoenmaker$b Wim$4edt$4http://id.loc.gov/vocabulary/relators/edt 702 $aDe Gersem$b Herbert$4edt$4http://id.loc.gov/vocabulary/relators/edt 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910360854203321 996 $aNanoelectronic Coupled Problems Solutions$91732601 997 $aUNINA