LEADER 00877nam0-22003011i-450- 001 990006683610403321 005 20001010 035 $a000668361 035 $aFED01000668361 035 $a(Aleph)000668361FED01 035 $a000668361 100 $a20001010d--------km-y0itay50------ba 101 0 $aita 105 $ay-------001yy 200 1 $aDISCOVERING casual structure$f[di] Clark C. Glymour...[e altri]$gWith a foreword by Herbert A. Simon.- 210 $aOrlando [Flor.]$cAcademic Press Inc.$d1987 215 $aXVIII,394 p., 23 cm 676 $a300.1 702 1$aGlymour,$bClark 702 1$aSimon,$bHerbert Alexander$f<1916-2001> 801 0$aIT$bUNINA$gRICA$2UNIMARC 901 $aBK 912 $a990006683610403321 952 $aVI E 297$b4688$fFSPBC 959 $aFSPBC 996 $aDISCOVERING casual structure$9616828 997 $aUNINA DB $aGEN01 LEADER 01177nam 2200361 450 001 9910349359403321 005 20230423092026.0 010 $a1-7281-1003-3 035 $a(CKB)4100000009825451 035 $a(NjHacI)994100000009825451 035 $a(EXLCZ)994100000009825451 100 $a20230423d2019 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$a2019 IEEE East-West Design & Test Symposium (EWDTS) /$fInstitute of Electrical and Electronics Engineers 210 1$aPiscataway, NJ :$cIEEE,$d2019. 210 4$dİ2019 215 $a1 online resource (116 pages) 311 $a1-7281-1004-1 320 $aIncludes bibliographical references and index. 517 $a2019 IEEE East-West Design & Test Symposium 606 $aElectrical engineering$xData processing$vCongresses 615 0$aElectrical engineering$xData processing 676 $a621.30285 801 0$bNjHacI 801 1$bNjHacl 906 $aPROCEEDING 912 $a9910349359403321 996 $a2019 IEEE East-West Design & Test Symposium (EWDTS)$92514509 997 $aUNINA