LEADER 05189nam 22005535 450 001 9911018758603321 005 20250723130302.0 010 $a3-031-85114-5 024 7 $a10.1007/978-3-031-85114-8 035 $a(MiAaPQ)EBC32234559 035 $a(Au-PeEL)EBL32234559 035 $a(CKB)39710509800041 035 $a(DE-He213)978-3-031-85114-8 035 $a(OCoLC)1530382687 035 $a(EXLCZ)9939710509800041 100 $a20250723d2025 u| 0 101 0 $aeng 135 $aurcnu|||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aBulk-Driven Circuit Techniques for CMOS FDSOI Processes $eFrom Circuit Concept to Implementations /$fedited by Friedel Gerfers 205 $a1st ed. 2025. 210 1$aCham :$cSpringer Nature Switzerland :$cImprint: Springer,$d2025. 215 $a1 online resource (357 pages) 311 08$a3-031-85113-7 327 $aChapter 1. Common-Source Amplifier Feedback using Back-Gate Transconductance -- Chapter 2. Transconductance Amplifier Linearization using Active Back-Gate Input Signal Injection -- Chapter 3. A Gain-enhanced Inverter-based OTA Employing Active Body-Bias Feedback -- Chapter 4. Ultra Low-Power Voltage-Mode VCSEL-Driver with Back-Gate Bias Tuning -- Chapter 5. Maximizing the Figures of Merit, Temperature Range, and Optimizing the Algorithmic Design Methodologies Based on Constant Current Density Bias for FDSOI Analog-Mixed-Signal, Digital, mm-Wave, and Fibreoptic Circuits from the Back-Gate Voltage -- Chapter 6. A Back-Gate Linearization Technique for Current-Steering DACs -- Chapter 7. Highly-Linear T&H-Amplifiers Utilizing Bandwidth Boosting for Time-Interleaved ADCs -- Chapter 8. High-Speed Flash ADC using Bulk-Driven Flash Reference Generation Technique -- Chapter 9. RF Switches in CMOS FDSOI Process ? from Circuit Concepts to Implementation -- Chapter 10. Variable Gain-Control with Bulk Biasing in mmW Amplifier. 330 $aIn the contemporary technology landscape dominated by digital-centric systems and applications, the significance of analog front-end signal processing remains indispensable. The precision and performance of critical analog, mixed-signal or mm-wave components such as low-noise amplifiers, equalizers, and data converters are fundamentally determined by technological parameters, such as transconductance, DC gain, device matching, linearity, and timing accuracy, among others. Enhancing these parameters through intrinsic design improvements presents a significant challenge and becomes infeasible beyond certain limits with state-of-the-art circuit design techniques. As the performance of CMOS transistors is fundamentally constrained, foreground or background calibration schemes are commonly employed to mitigate the limitations of MOS devices. However, these constraints can be effectively addressed through the implementation of active and passive bulk-driven circuits enabled by silicon-on-insulator (SOI) CMOS technologies. Fully-Depleted Silicon-on-Insulator (FD-SOI) CMOS technologies offer superior transistor characteristics compared to standard bulk CMOS technology, providing enhanced electrical performance, improved power efficiency, and better scalability. This book offers a comprehensive analysis of FD-SOI CMOS technology, presenting key innovations in design methodologies and circuit implementations adopting bulk-biasing techniques across analog, digital, mixed-signal, and mmWave circuits and systems. It addresses critical transistor limitations, including finite transistor gain, offset, mismatch, noise and linearity, among others. The authors provide detailed technical insights, mathematical modelling, design approaches and circuit realizations covering circuit advances using both static and dynamic transistor body-biasing techniques. Emphasis is placed on overcoming state-of-the-art circuit limitations such as finite DC gain, bandwidth, matching/accuracy and power efficiency. These performance metrics are rigorously investigated through mathematical modelling, validated through simulation and experimentally demonstrated using both dynamic and static body-biasing architectures. An essential guide for innovations using dynamic and static transistor body-biasing techniques; Describes FD-SOI CMOS bulk physics incl. the impact on technology parameters; Presents advanced active and passive body-biasing design methods. 606 $aElectronic circuit design 606 $aEmbedded computer systems 606 $aMaterials 606 $aElectronics Design and Verification 606 $aEmbedded Systems 606 $aMaterials for Devices 615 0$aElectronic circuit design. 615 0$aEmbedded computer systems. 615 0$aMaterials. 615 14$aElectronics Design and Verification. 615 24$aEmbedded Systems. 615 24$aMaterials for Devices. 676 $a621.3815 700 $aGerfers$b Friedel$0725301 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9911018758603321 996 $aBulk-Driven Circuit Techniques for CMOS FDSOI Processes$94415483 997 $aUNINA LEADER 01891nam 2200397z- 450 001 9910347057003321 005 20210211 010 $a1000037337 035 $a(CKB)4920000000101946 035 $a(oapen)https://directory.doabooks.org/handle/20.500.12854/55217 035 $a(oapen)doab55217 035 $a(EXLCZ)994920000000101946 100 $a20202102d2013 |y 0 101 0 $aeng 135 $aurmn|---annan 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 00$aOn the structure-property correlation and the evolution of Nanofeatures in 12-13.5% Cr oxide dispersion strengthened ferritic steels 210 $cKIT Scientific Publishing$d2013 215 $a1 online resource (XX, 199 p. p.) 225 1 $aSchriftenreihe des Instituts für Angewandte Materialien, Karlsruher Institut für Technologie 311 08$a3-7315-0141-4 330 $aMain objective of this work is to develop, by systematic variation of the chemical composition, and TMP, 14% Cr nano-structured ferritic alloys with significantly improved high-temperature properties compared to currently available ODS alloys. Application of state-of-the-art characterization tools shall lead to an integrated understanding of structure-property correlation and the formation mechanism of nanoparticles. 606 $aTechnology: general issues$2bicssc 610 $alow cycle fatigue 610 $aODS ferritic steel 610 $athermal-mechanical processing 610 $atransmission electron microscopy 610 $aX-ray absorption fine structure 615 7$aTechnology: general issues 700 $aHe$b Pei$4auth$01312689 906 $aBOOK 912 $a9910347057003321 996 $aOn the structure-property correlation and the evolution of Nanofeatures in 12-13.5% Cr oxide dispersion strengthened ferritic steels$93030916 997 $aUNINA