LEADER 00980cam0-2200313---450 001 990004044310403321 005 20221212145916.0 035 $a000404431 035 $aFED01000404431 035 $a(Aleph)000404431FED01 035 $a000404431 100 $a19990604d1986----km-y0itay50------ba 101 0 $afre 102 $aFR 105 $ay-------001yy 200 1 $aAnthropologie et politique au 17. siecle$e(etudes sur Spinoza)$fA. Matheron 210 $aParis$cLibrairie Philosophique J. Vrin$d1986 215 $a458 p.$d23 cm 517 1 $aAnthropologie et politique au XVIIe siecle 610 0 $aSpinoza, Baruch : de (filosofo, 1632-1677)$aStudi$aAntropologia$aPolitica 676 $a199 700 1$aMatheron,$bAlexandre$0154662 801 0$aIT$bUNINA$gRICA$2UNIMARC 901 $aBK 912 $a990004044310403321 952 $aP.1 6V SPIN/S 50$bDDF.630$fFLFBC 959 $aFLFBC 996 $aAnthropologie et politique au 17. siecle$91134052 997 $aUNINA LEADER 01772nam 2200385z- 450 001 9910346703003321 005 20210211 010 $a1000034759 035 $a(CKB)4920000000094664 035 $a(oapen)https://directory.doabooks.org/handle/20.500.12854/49267 035 $a(oapen)doab49267 035 $a(EXLCZ)994920000000094664 100 $a20202102d2013 |y 0 101 0 $aeng 135 $aurmn|---annan 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 00$aHigh Cycle Fatigue of Al and Cu Thin Films by a Novel High-Throughput Method 210 $cKIT Scientific Publishing$d2013 215 $a1 online resource (XII, 140 p. p.) 225 1 $aSchriftenreihe des Instituts für Angewandte Materialien, Karlsruher Institut für Technologie 311 08$a3-7315-0025-6 330 $aIn the last two decades, the reliability of small electronic devices used in automotive or consumer electronics gained researchers attention. Thus, there is the need to understand the fatigue properties and damage mechanisms of thin films. In this thesis a novel high-throughput testing method for thin films on Si substrate is presented. The specialty of this method is to test one sample at different strain amplitudes at the same time and measure an entire lifetime curve with only one experiment. 606 $aTechnology: general issues$2bicssc 610 $acantilever bending 610 $adamage structure 610 $aFatigue 610 $athin film 615 7$aTechnology: general issues 700 $aBurger$b Sofie$4auth$01302194 906 $aBOOK 912 $a9910346703003321 996 $aHigh Cycle Fatigue of Al and Cu Thin Films by a Novel High-Throughput Method$93026232 997 $aUNINA