LEADER 01440nam  2200373z- 450 
001 9910346672903321
005 20231214133557.0
010   $a3-03897-528-1
035   $a(CKB)4920000000094938
035   $a(oapen)https://directory.doabooks.org/handle/20.500.12854/58480
035   $a(EXLCZ)994920000000094938
100   $a20202102d2019      |y         0
101 0 $aeng
135   $aurmn|---annan
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aRietveld Refinement in the Characterization of Crystalline Materials
210   $cMDPI - Multidisciplinary Digital Publishing Institute$d2019
215   $a1 electronic resource (88 p.)
311   $a3-03897-527-3 
330   $aThis Special Issue serves as a crystallographic forum covering various aspects of material science that have in common the use of the powerful Rietveld method in the analysis of the powder XRD patterns of investigated compounds.
610   $aRietveld method
610   $aStructural characterization
610   $aMicrostructural analysis
610   $aCrystalline materials
610   $aStructural materials
610   $aX-ray and neutron diffraction
610   $aFunctional materials
700   $aIgor Djerdj (Ed.)$4auth$01305934
906   $aBOOK
912   $a9910346672903321
996   $aRietveld Refinement in the Characterization of Crystalline Materials$93028036
997   $aUNINA