LEADER 00626nam0-22002291i-450- 001 990001307120403321 035 $a000130712 035 $aFED01000130712 035 $a(Aleph)000130712FED01 035 $a000130712 100 $a20000920d--------km-y0itay50------ba 101 1 $aeng 200 1 $aNonstandard analysis$eA Pratical Guide with Applications.$fby LUTZ R. - GOZE M. 700 1$aLutz,$bRobert$059234 801 0$aIT$bUNINA$gRICA$2UNIMARC 901 $aBK 912 $a990001307120403321 952 $aC-20-(881$b20572$fMA1 959 $aMA1 996 $aNonstandard analysis$9261845 997 $aUNINA DB $aING01 LEADER 01824nam 22005053a 450 001 9910346672903321 005 20250203235435.0 010 $a9783038975281 010 $a3038975281 024 8 $a10.3390/books978-3-03897-528-1 035 $a(CKB)4920000000094938 035 $a(oapen)https://directory.doabooks.org/handle/20.500.12854/58480 035 $a(ScCtBLL)32bc0069-6d6b-431e-bf49-a00f1769b98e 035 $a(OCoLC)1163837055 035 $a(oapen)doab58480 035 $a(EXLCZ)994920000000094938 100 $a20250203i20192019 uu 101 0 $aeng 135 $aurmn|---annan 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 00$aRietveld Refinement in the Characterization of Crystalline Materials$fIgor Djerdj 210 $cMDPI - Multidisciplinary Digital Publishing Institute$d2019 210 1$aBasel, Switzerland :$cMDPI,$d2019. 215 $a1 electronic resource (88 p.) 311 08$a9783038975274 311 08$a3038975273 330 $aThis Special Issue serves as a crystallographic forum covering various aspects of material science that have in common the use of the powerful Rietveld method in the analysis of the powder XRD patterns of investigated compounds. 606 $aChemistry$2bicssc 610 $aRietveld method 610 $aStructural characterization 610 $aMicrostructural analysis 610 $aCrystalline materials 610 $aStructural materials 610 $aX-ray and neutron diffraction 610 $aFunctional materials 615 7$aChemistry 700 $aDjerdj$b Igor$01786235 801 0$bScCtBLL 801 1$bScCtBLL 906 $aBOOK 912 $a9910346672903321 996 $aRietveld Refinement in the Characterization of Crystalline Materials$94317651 997 $aUNINA