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035   $aPARLA170630$9ExL
040   $aDip.to Scienze pedagogiche$bita
082 0 $a302.23092
100 1 $aMcLuhan, Eric$0143814
245 10$aEssential McLuhan /$cedited by Eric McLuhan and Frank Zingrone
260   $aNew Fetter Lane, London :$bRoutledge,$c1997
300   $a407 p. :$bill. ;$c24 cm.
500   $aInclude bibliografi (p. 397-401).
650  4$aMass media$xAspetti sociali
650  4$aMass media$xFilosofia
650  4$aMcLuhan, Marshall, 1911-
700 1 $aZingrone, Frank
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997   $aUNISALENTO
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135   $aurmn|---annan
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 00$aRietveld Refinement in the Characterization of Crystalline Materials$fIgor Djerdj
210   $cMDPI - Multidisciplinary Digital Publishing Institute$d2019
210  1$aBasel, Switzerland :$cMDPI,$d2019.
215   $a1 electronic resource (88 p.)
311 08$a9783038975274 
311 08$a3038975273 
330   $aThis Special Issue serves as a crystallographic forum covering various aspects of material science that have in common the use of the powerful Rietveld method in the analysis of the powder XRD patterns of investigated compounds.
606   $aChemistry$2bicssc
610   $aRietveld method
610   $aStructural characterization
610   $aMicrostructural analysis
610   $aCrystalline materials
610   $aStructural materials
610   $aX-ray and neutron diffraction
610   $aFunctional materials
615  7$aChemistry
700   $aDjerdj$b Igor$01786235
801  0$bScCtBLL
801  1$bScCtBLL
906   $aBOOK
912   $a9910346672903321
996   $aRietveld Refinement in the Characterization of Crystalline Materials$94317651
997   $aUNINA