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035   $a(DE-He213)978-3-030-13654-3
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100   $a20190523d2019      u|         0
101 0 $aeng
135   $aurcnu||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aAtomic Force Microscopy /$fby Bert Voigtländer
205   $a2nd ed. 2019.
210  1$aCham :$cSpringer International Publishing :$cImprint: Springer,$d2019.
215   $a1 online resource (329 pages)
225 1 $aNanoScience and Technology,$x1434-4904
311   $a3-030-13653-1 
327   $aIntroduction -- Part I: Scanning Probe Microscopy Instrumentation -- Harmonic Oscillator -- Technical Aspects of Scanning Probe Microscopy -- Scanning Probe Microscopy Designs -- Electronics for Scanning Probe Microscopy -- Lock-In Technique -- Data Representation and Image Processing -- Artifacts in SPM -- Work Function, Contact Potential, and Kelvin Probe -- Part II: Atomic Force Microscopy (AFM) -- Forces between Tip and Sample -- Technical Aspects of Atomic Force Microscopy -- Static Atomic Force Microscopy -- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy -- Intermittent Contact Mode/Tapping Mode -- Mapping of Mechanical Properties Using Force-Distance -- Frequency Modulation (FM) Mode in Dynamic Atomic Force -- Noise in Atomic Force Microscopy -- Quartz Sensors in Atomic Force Microscopy.
330   $aThis book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.
410  0$aNanoScience and Technology,$x1434-4904
606   $aSpectrum analysis
606   $aMicroscopy
606   $aNanotechnology
606   $aNanoscience
606   $aNanoscience
606   $aNanostructures
606   $aSpectroscopy and Microscopy$3https://scigraph.springernature.com/ontologies/product-market-codes/P31090
606   $aNanotechnology$3https://scigraph.springernature.com/ontologies/product-market-codes/Z14000
606   $aNanotechnology and Microengineering$3https://scigraph.springernature.com/ontologies/product-market-codes/T18000
606   $aNanoscale Science and Technology$3https://scigraph.springernature.com/ontologies/product-market-codes/P25140
606   $aBiological Microscopy$3https://scigraph.springernature.com/ontologies/product-market-codes/L26000
615  0$aSpectrum analysis.
615  0$aMicroscopy.
615  0$aNanotechnology.
615  0$aNanoscience.
615  0$aNanoscience.
615  0$aNanostructures.
615 14$aSpectroscopy and Microscopy.
615 24$aNanotechnology.
615 24$aNanotechnology and Microengineering.
615 24$aNanoscale Science and Technology.
615 24$aBiological Microscopy.
676   $a502.82
676   $a620.5
700   $aVoigtländer$b Bert$4aut$4http://id.loc.gov/vocabulary/relators/aut$0770205
906   $aBOOK
912   $a9910337930303321
996   $aAtomic Force Microscopy$91570972
997   $aUNINA