LEADER 02192oam 2200577I 450 001 9910704248503321 005 20160129144054.0 035 $a(CKB)5470000002439190 035 $a(OCoLC)885009221 035 $a(EXLCZ)995470000002439190 100 $a20140731d1952 ua 0 101 0 $aeng 135 $aurbn||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aGeologic guides to prospecting for carnotite deposits on Colorado Plateau /$fby Doris Blackman Weir 210 1$a[Washington, D.C.] :$cUnited States Department of the Interior, Geological Survey,$d1952. 210 2$aWashington :$cUnited States Government Printing Office. 215 $a1 online resource (iii, 15-27 pages) $cillustrations 225 1 $aGeological Survey bulletin ;$v988-B 225 1 $aContributions to the geology of uranium ;$v1952 300 $aTitle from title screen (viewed July 21, 2014). 300 $a"This report concerns work done on behalf of the U.S. Atomic Energy Commission and is published with the permission of the Commission." 320 $aIncludes bibliographical references (page 27). 517 1 $aContributions to the geology of uranium, 1952, geologic guides to prospecting for carnotite 606 $aCarnotite$zColorado Plateau 606 $aProspecting$zColorado Plateau 606 $aMines and mineral resources$zColorado Plateau 606 $aCarnotite$2fast 606 $aMines and mineral resources$2fast 606 $aProspecting$2fast 607 $aUnited States$zColorado Plateau$2fast 615 0$aCarnotite 615 0$aProspecting 615 0$aMines and mineral resources 615 7$aCarnotite. 615 7$aMines and mineral resources. 615 7$aProspecting. 700 $aWeir$b Doris Blackman$01402185 712 02$aGeological Survey (U.S.), 712 02$aU.S. Atomic Energy Commission, 801 0$bCOP 801 1$bCOP 801 2$bOCLCO 801 2$bOCLCF 801 2$bGPO 906 $aBOOK 912 $a9910704248503321 996 $aGeologic guides to prospecting for carnotite deposits on Colorado Plateau$93472184 997 $aUNINA LEADER 03302nam 22005295 450 001 9910337645003321 005 20200630220158.0 010 $a3-030-03238-8 024 7 $a10.1007/978-3-030-03238-8 035 $a(CKB)4100000007223587 035 $a(MiAaPQ)EBC5620202 035 $a(DE-He213)978-3-030-03238-8 035 $a(PPN)232967040 035 $a(EXLCZ)994100000007223587 100 $a20181214d2019 u| 0 101 0 $aeng 135 $aurcnu|||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aLearning from VLSI Design Experience /$fby Weng Fook Lee 205 $a1st ed. 2019. 210 1$aCham :$cSpringer International Publishing :$cImprint: Springer,$d2019. 215 $a1 online resource (xxix, 214 pages) 311 $a3-030-03237-X 327 $aChapter 1. Introduction -- Chapter 2. Design Methodology and Flow -- Chapter 3. Multiple Clock Design -- Chapter 4. Latch Inference -- Chapter 5. Design for Test -- Chapter 6. Signed Verilog -- Chapter 7. State Machine -- Chapter 8. RTL Coding Guideline -- Chapter 9. Code Coverage. . 330 $aThis book shares with readers practical design knowledge gained from the author?s 24 years of IC design experience. The author addresses issues and challenges faced commonly by IC designers, along with solutions and workarounds. Guidelines are described for tackling issues such as clock domain crossing, using lockup latch to cross clock domains during scan shift, implementation of scan chains across power domain, optimization methods to improve timing, how standard cell libraries can aid in synthesis optimization, BKM (best known method) for RTL coding, test compression, memory BIST, usage of signed Verilog for design requiring +ve and -ve calculations, state machine, code coverage and much more. Numerous figures and examples are provided to aid the reader in understanding the issues and their workarounds. Addresses practical design issues and their workarounds; Discusses issues such as CDC, crossing clock domain in shift, scan chains across power domain, timing optimization, standard cell library influence on synthesis, DFT, code coverage, state machine; Provides readers with an RTL coding guideline, based on real experience. 606 $aElectronic circuits 606 $aMicroprocessors 606 $aElectronics 606 $aMicroelectronics 606 $aCircuits and Systems$3https://scigraph.springernature.com/ontologies/product-market-codes/T24068 606 $aProcessor Architectures$3https://scigraph.springernature.com/ontologies/product-market-codes/I13014 606 $aElectronics and Microelectronics, Instrumentation$3https://scigraph.springernature.com/ontologies/product-market-codes/T24027 615 0$aElectronic circuits. 615 0$aMicroprocessors. 615 0$aElectronics. 615 0$aMicroelectronics. 615 14$aCircuits and Systems. 615 24$aProcessor Architectures. 615 24$aElectronics and Microelectronics, Instrumentation. 676 $a621.395 700 $aLee$b Weng Fook$4aut$4http://id.loc.gov/vocabulary/relators/aut$0867193 906 $aBOOK 912 $a9910337645003321 996 $aLearning from VLSI Design Experience$91935535 997 $aUNINA LEADER 01353nam0 22003131i 450 001 UON00430420 005 20231205104904.825 010 $a978-48-633-7094-4 100 $a20130925d2011 |0itac50 ba 101 $ajpn 102 $aJP 105 $a|||| 1|||| 200 1 $aBunken to ibutsu no kyo?kai$eChu?goku shutsudo kandoku shiryo? no seitaiteki kenkyu?$fMomiyama Akira$gSato? Makoto hen 210 $aTo?kyo?$cTo?kyo? Gaikokugo Daigaku Ajia, Afurika Gengo Bunka Kenkyu?jo$d2011 215 $aII, 282 p.$cill.$d26 cm 606 $aArcheologia$xCina$xIscrizioni$3UONC059140$2FI 606 $aCina$xStoria$xDinastia Han (202 a.C.-220 d.C.)$3UONC000928$2FI 606 $aINCISIONI SU LEGNO$xCINA$3UONC084604$2FI 620 $aJP$dTo?kyo?$3UONL000031 686 $aCIN XX A$cCINA - EPIGRAFIA$2A 702 0$aMOMIYAMA Akira$3UONV218348 702 0$aSATO Makoto$3UONV218349 712 $aTokyo Gaikokugo Daigaku Ajia Afurika Gengo Bunka Kenkyujo$3UONV276717$4650 801 $aIT$bSOL$c20250411$gRICA 899 $aSIBA - SISTEMA BIBLIOTECARIO DI ATENEO$2UONSI 912 $aUON00430420 950 $aSIBA - SISTEMA BIBLIOTECARIO DI ATENEO$dSI CIN XX A 022 $eSI 6652 7 022 996 $aBunken to ibutsu no kyo?kai$91335131 997 $aUNIOR