LEADER 03302nam 22005295 450 001 9910337645003321 005 20251116212924.0 010 $a3-030-03238-8 024 7 $a10.1007/978-3-030-03238-8 035 $a(CKB)4100000007223587 035 $a(MiAaPQ)EBC5620202 035 $a(DE-He213)978-3-030-03238-8 035 $a(PPN)232967040 035 $a(EXLCZ)994100000007223587 100 $a20181214d2019 u| 0 101 0 $aeng 135 $aurcnu|||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aLearning from VLSI Design Experience /$fby Weng Fook Lee 205 $a1st ed. 2019. 210 1$aCham :$cSpringer International Publishing :$cImprint: Springer,$d2019. 215 $a1 online resource (xxix, 214 pages) 311 08$a3-030-03237-X 327 $aChapter 1. Introduction -- Chapter 2. Design Methodology and Flow -- Chapter 3. Multiple Clock Design -- Chapter 4. Latch Inference -- Chapter 5. Design for Test -- Chapter 6. Signed Verilog -- Chapter 7. State Machine -- Chapter 8. RTL Coding Guideline -- Chapter 9. Code Coverage. . 330 $aThis book shares with readers practical design knowledge gained from the author?s 24 years of IC design experience. The author addresses issues and challenges faced commonly by IC designers, along with solutions and workarounds. Guidelines are described for tackling issues such as clock domain crossing, using lockup latch to cross clock domains during scan shift, implementation of scan chains across power domain, optimization methods to improve timing, how standard cell libraries can aid in synthesis optimization, BKM (best known method) for RTL coding, test compression, memory BIST, usage of signed Verilog for design requiring +ve and -ve calculations, state machine, code coverage and much more. Numerous figures and examples are provided to aid the reader in understanding the issues and their workarounds. Addresses practical design issues and their workarounds; Discusses issues such as CDC, crossing clock domain in shift, scan chains across power domain, timing optimization, standard cell library influence on synthesis, DFT, code coverage, state machine; Provides readers with an RTL coding guideline, based on real experience. 606 $aElectronic circuits 606 $aMicroprocessors 606 $aElectronics 606 $aMicroelectronics 606 $aCircuits and Systems$3https://scigraph.springernature.com/ontologies/product-market-codes/T24068 606 $aProcessor Architectures$3https://scigraph.springernature.com/ontologies/product-market-codes/I13014 606 $aElectronics and Microelectronics, Instrumentation$3https://scigraph.springernature.com/ontologies/product-market-codes/T24027 615 0$aElectronic circuits. 615 0$aMicroprocessors. 615 0$aElectronics. 615 0$aMicroelectronics. 615 14$aCircuits and Systems. 615 24$aProcessor Architectures. 615 24$aElectronics and Microelectronics, Instrumentation. 676 $a621.395 700 $aLee$b Weng Fook$4aut$4http://id.loc.gov/vocabulary/relators/aut$0867193 906 $aBOOK 912 $a9910337645003321 996 $aLearning from VLSI Design Experience$91935535 997 $aUNINA