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101 0 $aeng
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181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 00$aBismuth $eadvanced applications and defects characterization /$fYing Zhou, Fan Dong, Shengming Jin, editors
210  1$a[Place of publication not identified] :$cIntechOpen,$d[2018]
210  4$dİ2018
215   $a1 online resource (230 pages) $cillustrations
311   $a1-78923-262-7 
320   $aIncludes bibliographical references.
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702   $aZhou$b Ying
702   $aDong$b Fan
702   $aJin$b Shengming
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