LEADER 01289nam  2200409   450 
001 9910317765203321
005 20221017074534.0
010   $a1-83881-776-X
010   $a1-78985-170-X
035   $a(CKB)4970000000100431
035   $a(NjHacI)994970000000100431
035   $a(EXLCZ)994970000000100431
100   $a20221017d2019      uy             0
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 00$aAtomic-force Microscopy and Its Applications /$fedited by Tomasz Tan?ski, Marcin Staszuk, and Bogus?aw Zie?bowicz
210  1$aLondon, United Kingdom :$cIntechOpen,$d2019.
215   $a1 online resource (114 pages) $cillustrations some color
311   $a1-78985-169-6 
320   $aIncludes bibliographical references.
606   $aAnalytical chemistry
606   $aAtomic force microscopy
615  0$aAnalytical chemistry.
615  0$aAtomic force microscopy.
676   $a502.82
702   $aTan?ski$b Tomasz
702   $aStaszuk$b Marcin
702   $aZie?bowicz$b Bogus?aw
801  0$bNjHacI
801  1$bNjHacl
906   $aBOOK
912   $a9910317765203321
996   $aAtomic-force Microscopy and Its Applications$91968916
997   $aUNINA