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010   $a3-319-75687-7
024 7 $a10.1007/978-3-319-75687-5
035   $a(CKB)4100000002892421
035   $a(MiAaPQ)EBC5341914
035   $a(DE-He213)978-3-319-75687-5
035   $a(PPN)225550245
035   $a(EXLCZ)994100000002892421
100   $a20180309d2018      u|         0
101 0 $aeng
135   $aurcnu||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aKelvin Probe Force Microscopy $eFrom Single Charge Detection to Device Characterization /$fedited by Sascha Sadewasser, Thilo Glatzel
205   $a1st ed. 2018.
210  1$aCham :$cSpringer International Publishing :$cImprint: Springer,$d2018.
215   $a1 online resource (530 pages)
225 1 $aSpringer Series in Surface Sciences,$x0931-5195 ;$v65
311   $a3-319-75686-9 
327   $aPart I: Technical aspects -- Experimental technique and working modes -- Dissipation KPFM -- KPFM techniques for liquid environment -- Open-loop and excitation KPFM -- Quantitative KPFM on semiconductor devices -- KPFM with atomic resolution.- KPFM with atomic resolution -- Part II: Theoretical Aspects -- Local dipoles in atomic and Kelvin probe force microscopy -- Influence of the tip electrostatic field on high resolution KPFM measurements -- Modelling the electrostatic field of a cantilever -- Theory of open-loop KPFM -- KPFM in a SPM simulator -- Electrostatic interactions with dielectric samples -- Part III: Applications -- Kelvin spectroscopy of single molecules -- KPFM for single molecule chemistry -- Optoelectronic properties of single molecules -- Quantitative KPFM of molecular self-assemblies -- Applications of KPFM in liquids -- KPFM of organic solar cell materials -- Correlation of optical and electrical nanoscale properties of organic devices -- KPFM for catalysis -- Quantitative electrical measurements of SiC devices.
330   $aThis book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors? previous volume ?Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,? presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.
410  0$aSpringer Series in Surface Sciences,$x0931-5195 ;$v65
606   $aSpectrum analysis
606   $aMicroscopy
606   $aMaterials?Surfaces
606   $aThin films
606   $aNanotechnology
606   $aMaterials science
606   $aPhysical measurements
606   $aMeasurement
606   $aSpectroscopy and Microscopy$3https://scigraph.springernature.com/ontologies/product-market-codes/P31090
606   $aSurfaces and Interfaces, Thin Films$3https://scigraph.springernature.com/ontologies/product-market-codes/Z19000
606   $aNanotechnology and Microengineering$3https://scigraph.springernature.com/ontologies/product-market-codes/T18000
606   $aCharacterization and Evaluation of Materials$3https://scigraph.springernature.com/ontologies/product-market-codes/Z17000
606   $aMeasurement Science and Instrumentation$3https://scigraph.springernature.com/ontologies/product-market-codes/P31040
615  0$aSpectrum analysis.
615  0$aMicroscopy.
615  0$aMaterials?Surfaces.
615  0$aThin films.
615  0$aNanotechnology.
615  0$aMaterials science.
615  0$aPhysical measurements.
615  0$aMeasurement.
615 14$aSpectroscopy and Microscopy.
615 24$aSurfaces and Interfaces, Thin Films.
615 24$aNanotechnology and Microengineering.
615 24$aCharacterization and Evaluation of Materials.
615 24$aMeasurement Science and Instrumentation.
676   $a530.8
702   $aSadewasser$b Sascha$4edt$4http://id.loc.gov/vocabulary/relators/edt
702   $aGlatzel$b Thilo$4edt$4http://id.loc.gov/vocabulary/relators/edt
906   $aBOOK
912   $a9910300548203321
996   $aKelvin Probe Force Microscopy$92523334
997   $aUNINA