LEADER 04580nam 22007455 450 001 9910300529803321 005 20200706103011.0 010 $a3-319-70181-9 024 7 $a10.1007/978-3-319-70181-3 035 $a(CKB)4340000000223525 035 $a(DE-He213)978-3-319-70181-3 035 $a(MiAaPQ)EBC5163241 035 $a(PPN)221247289 035 $a(EXLCZ)994340000000223525 100 $a20171127d2018 u| 0 101 0 $aeng 135 $aurnn|008mamaa 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aNanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals$b[electronic resource] $eA Scanning Probe Microscopy Approach /$fby Nicholas D. Kay 205 $a1st ed. 2018. 210 1$aCham :$cSpringer International Publishing :$cImprint: Springer,$d2018. 215 $a1 online resource (XXI, 122 p. 67 illus., 14 illus. in color.) 225 1 $aSpringer Theses, Recognizing Outstanding Ph.D. Research,$x2190-5053 311 $a3-319-70180-0 320 $aIncludes bibliographical references. 327 $aIntroduction -- Background -- Materials and Methods -- Morphology of 2D Materials and their Heterostructures -- Nanomechanical Phenomena -- Nanoelectromechanical Phenomena -- Further Work and Future Directions -- Conclusion. 330 $aThis thesis introduces a unique approach of applying atomic force microscopy to study the nanoelectromechanical properties of 2D materials, providing high-resolution computer-generated imagery (CGI) and diagrams to aid readers? understanding and visualization. The isolation of graphene and, shortly after, a host of other 2D materials has attracted a great deal of interest in the scientific community for both their range of extremely desirable and their record-breaking properties. Amongst these properties are some of the highest elastic moduli and tensile strengths ever observed in nature. The work, which was undertaken at Lancaster University?s Physics department in conjunction with the University of Manchester and the National Physical Laboratory, offers a new approach to understanding the nanomechanical and nanoelectromechanical properties of 2D materials by utilising the nanoscale and nanosecond resolution of ultrasonic force and heterodyne force microscopy (UFM and HFM) ? both contact mode atomic force microscopy (AFM) techniques. Using this approach and developing several other new techniques the authors succeeded in probing samples? subsurface and mechanical properties, which would otherwise remain hidden. Lastly, by using a new technique, coined electrostatic heterodyne force microscopy (E-HFM), the authors were able to observe nanoscale electromechanical vibrations with a nanometre and nanosecond resolution, in addition to probing the local electrostatic environment of devices fabricated from 2D materials. 410 0$aSpringer Theses, Recognizing Outstanding Ph.D. Research,$x2190-5053 606 $aSurfaces (Physics) 606 $aInterfaces (Physical sciences) 606 $aThin films 606 $aNanotechnology 606 $aSpectroscopy 606 $aMicroscopy 606 $aNanoscale science 606 $aNanoscience 606 $aNanostructures 606 $aSurface and Interface Science, Thin Films$3https://scigraph.springernature.com/ontologies/product-market-codes/P25160 606 $aNanotechnology$3https://scigraph.springernature.com/ontologies/product-market-codes/Z14000 606 $aSpectroscopy and Microscopy$3https://scigraph.springernature.com/ontologies/product-market-codes/P31090 606 $aNanoscale Science and Technology$3https://scigraph.springernature.com/ontologies/product-market-codes/P25140 615 0$aSurfaces (Physics). 615 0$aInterfaces (Physical sciences). 615 0$aThin films. 615 0$aNanotechnology. 615 0$aSpectroscopy. 615 0$aMicroscopy. 615 0$aNanoscale science. 615 0$aNanoscience. 615 0$aNanostructures. 615 14$aSurface and Interface Science, Thin Films. 615 24$aNanotechnology. 615 24$aSpectroscopy and Microscopy. 615 24$aNanoscale Science and Technology. 676 $a620.5 700 $aKay$b Nicholas D$4aut$4http://id.loc.gov/vocabulary/relators/aut$01058306 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910300529803321 996 $aNanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals$92499083 997 $aUNINA