LEADER 01853nam 2200493Ia 450 001 9910701118603321 005 20111221105130.0 035 $a(CKB)5470000002415865 035 $a(OCoLC)768998234 035 $a(EXLCZ)995470000002415865 100 $a20111221d2011 ua 0 101 0 $aeng 135 $aurcn||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aStatistical Energy Analysis (SEA) and Energy Finite Element Analysis (EFEA) predictions for a floor-equipped composite cylinder$b[electronic resource] /$fFerdinand W. Grosveld, Noah H. Schiller and Randolph H. Cabell 210 1$aHampton, Va. :$cNational Aeronautics and Space Administration, Langley Research Center,$d[2011] 215 $a1 online resource (44 pages) $ccolor illustrations 225 1 $aNASA/TM ;$v2011-217171 300 $aTitle from title screen (viewed on Dec. 21, 2011). 300 $a"August 2011." 320 $aIncludes bibliographical references (pages 17-18). 517 $aStatistical Energy Analysis 606 $aComets$2nasat 606 $aFinite element method$2nasat 606 $aVibrational stress$2nasat 606 $aAcoustics$2nasat 606 $aStatistical analysis$2nasat 615 7$aComets. 615 7$aFinite element method. 615 7$aVibrational stress. 615 7$aAcoustics. 615 7$aStatistical analysis. 700 $aGrosveld$b Ferdinand W$01391334 701 $aSchiller$b Noah H$01392070 701 $aCabell$b Randolph H$055389 712 02$aLangley Research Center. 801 0$bGPO 801 1$bGPO 906 $aBOOK 912 $a9910701118603321 996 $aStatistical Energy Analysis (SEA) and Energy Finite Element Analysis (EFEA) predictions for a floor-equipped composite cylinder$93446365 997 $aUNINA LEADER 04401nam 22008655 450 001 9910300410703321 005 20200701162733.0 010 $a4-431-55028-3 024 7 $a10.1007/978-4-431-55028-0 035 $a(CKB)3710000000244788 035 $a(EBL)1968611 035 $a(OCoLC)908090065 035 $a(SSID)ssj0001354154 035 $a(PQKBManifestationID)11896012 035 $a(PQKBTitleCode)TC0001354154 035 $a(PQKBWorkID)11322535 035 $a(PQKB)10917624 035 $a(DE-He213)978-4-431-55028-0 035 $a(MiAaPQ)EBC1968611 035 $a(PPN)181354497 035 $a(EXLCZ)993710000000244788 100 $a20140920d2015 u| 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aHigh-Resolution Spin-Resolved Photoemission Spectrometer and the Rashba Effect in Bismuth Thin Films /$fby Akari Takayama 205 $a1st ed. 2015. 210 1$aTokyo :$cSpringer Japan :$cImprint: Springer,$d2015. 215 $a1 online resource (92 p.) 225 1 $aSpringer Theses, Recognizing Outstanding Ph.D. Research,$x2190-5053 300 $aDescription based upon print version of record. 311 $a4-431-55027-5 320 $aIncludes bibliographical references. 327 $aIntroduction -- Basic Principle of Photoemission Spectroscopy and Spin Detector -- Development of High Resolution Spin-Resolved Photoemission Spectrometer -- Anomalous Rashba Effect of a Bi Thin Film on Si(111) -- Rashba Effect at Interface of a Bi Thin Film on Si(111) -- Conclusion. 330 $aIn this thesis, the author has developed a high-resolution spin-resolved photoemission spectrometer that achieves the world-best energy resolution of 8 meV. The author has designed a new, highly efficient mini Mott detector that has a large electron acceptance angle and an atomically flat gold target to enhance the efficiency of detecting scattered electrons.   The author measured the electron and spin structure of Bi thin film grown on a Si(111) surface to study the Rashba effect. Unlike the conventional Rashba splitting, an asymmetric in-plane spin polarization and a tremendous out-of-plane spin component were observed. Moreover, the author found that the spin polarization of Rashba surface states is reduced by decreasing the film thickness, which indicates the considerable interaction of Rashba spin-split states between the surface and Bi/Si interface. 410 0$aSpringer Theses, Recognizing Outstanding Ph.D. Research,$x2190-5053 606 $aSurfaces (Physics) 606 $aInterfaces (Physical sciences) 606 $aThin films 606 $aSpectrum analysis 606 $aMicroscopy 606 $aMaterials?Surfaces 606 $aPhysical measurements 606 $aMeasurement 606 $aSemiconductors 606 $aSurface and Interface Science, Thin Films$3https://scigraph.springernature.com/ontologies/product-market-codes/P25160 606 $aSpectroscopy and Microscopy$3https://scigraph.springernature.com/ontologies/product-market-codes/P31090 606 $aSurfaces and Interfaces, Thin Films$3https://scigraph.springernature.com/ontologies/product-market-codes/Z19000 606 $aMeasurement Science and Instrumentation$3https://scigraph.springernature.com/ontologies/product-market-codes/P31040 606 $aSemiconductors$3https://scigraph.springernature.com/ontologies/product-market-codes/P25150 615 0$aSurfaces (Physics) 615 0$aInterfaces (Physical sciences) 615 0$aThin films. 615 0$aSpectrum analysis. 615 0$aMicroscopy. 615 0$aMaterials?Surfaces. 615 0$aPhysical measurements. 615 0$aMeasurement. 615 0$aSemiconductors. 615 14$aSurface and Interface Science, Thin Films. 615 24$aSpectroscopy and Microscopy. 615 24$aSurfaces and Interfaces, Thin Films. 615 24$aMeasurement Science and Instrumentation. 615 24$aSemiconductors. 676 $a530 676 $a530.417 676 $a530.8 676 $a537.622 700 $aTakayama$b Akari$4aut$4http://id.loc.gov/vocabulary/relators/aut$0792815 906 $aBOOK 912 $a9910300410703321 996 $aHigh-Resolution Spin-Resolved Photoemission Spectrometer and the Rashba Effect in Bismuth Thin Films$91773052 997 $aUNINA