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010   $a3-319-04864-3
024 7 $a10.1007/978-3-319-04864-2
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035   $a(EBL)1731006
035   $a(OCoLC)902412555
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035   $a(PQKBTitleCode)TC0001244141
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035   $a(MiAaPQ)EBC1731006
035   $a(DE-He213)978-3-319-04864-2
035   $a(PPN)178784109
035   $a(EXLCZ)993710000000111952
100   $a20140508d2014      u|         0
101 0 $aeng
135   $aur|n|---|||||
181   $ctxt
182   $cc
183   $acr
200 10$aLaboratory Micro-X-Ray Fluorescence Spectroscopy $eInstrumentation and Applications /$fby Michael Haschke
205   $a1st ed. 2014.
210  1$aCham :$cSpringer International Publishing :$cImprint: Springer,$d2014.
215   $a1 online resource (367 p.)
225 1 $aSpringer Series in Surface Sciences,$x0931-5195 ;$v55
300   $aDescription based upon print version of record.
311   $a3-319-04863-5 
320   $aIncludes bibliographical references and index.
327   $aXRF-Basics -- Main Components of X-Ray Spectrometers -- Special Requirements for µ-XRF -- Quantification -- Sample Preparation -- Relations to Other Analytical Methods -- Applications.
330   $aMicro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems. This analytical technique has shown a dynamic development in the last 15 years and is used for the analysis of small particles, inclusions, of elemental distributions for a wide range of different applications both in research and quality control. The first experiments were performed on synchrotrons but there is a requirement for laboratory instruments which offers a fast and immediate access for analytical results. The book discuss the main components of a µ-XRF instrument and the different measurement modes, it gives an overview about the various instruments types, considers the special requirements for quantification of non-homogeneous materials and presents a wide range of application for single point and multi-point analysis as well as for distribution analysis in one, two and three dimensions.
410  0$aSpringer Series in Surface Sciences,$x0931-5195 ;$v55
606   $aSpectrum analysis
606   $aMicroscopy
606   $aMaterials?Surfaces
606   $aThin films
606   $aPhysical measurements
606   $aMeasurement
606   $aSurfaces (Physics)
606   $aInterfaces (Physical sciences)
606   $aSpectroscopy and Microscopy$3https://scigraph.springernature.com/ontologies/product-market-codes/P31090
606   $aSurfaces and Interfaces, Thin Films$3https://scigraph.springernature.com/ontologies/product-market-codes/Z19000
606   $aMeasurement Science and Instrumentation$3https://scigraph.springernature.com/ontologies/product-market-codes/P31040
606   $aSpectroscopy/Spectrometry$3https://scigraph.springernature.com/ontologies/product-market-codes/C11020
606   $aSurface and Interface Science, Thin Films$3https://scigraph.springernature.com/ontologies/product-market-codes/P25160
615  0$aSpectrum analysis.
615  0$aMicroscopy.
615  0$aMaterials?Surfaces.
615  0$aThin films.
615  0$aPhysical measurements.
615  0$aMeasurement.
615  0$aSurfaces (Physics)
615  0$aInterfaces (Physical sciences)
615 14$aSpectroscopy and Microscopy.
615 24$aSurfaces and Interfaces, Thin Films.
615 24$aMeasurement Science and Instrumentation.
615 24$aSpectroscopy/Spectrometry.
615 24$aSurface and Interface Science, Thin Films.
676   $a537.5352
700   $aHaschke$b Michael$4aut$4http://id.loc.gov/vocabulary/relators/aut$0791802
801  0$bMiAaPQ
801  1$bMiAaPQ
801  2$bMiAaPQ
906   $aBOOK
912   $a9910300389603321
996   $aLaboratory Micro-X-Ray Fluorescence Spectroscopy$91770416
997   $aUNINA