LEADER 05631nam 22008895 450 001 9910300384003321 005 20200701124709.0 010 $a3-642-37530-8 024 7 $a10.1007/978-3-642-37530-9 035 $a(CKB)3710000000078629 035 $a(DE-He213)978-3-642-37530-9 035 $a(SSID)ssj0001010797 035 $a(PQKBManifestationID)11933212 035 $a(PQKBTitleCode)TC0001010797 035 $a(PQKBWorkID)11002656 035 $a(PQKB)11755374 035 $a(MiAaPQ)EBC3107019 035 $a(PPN)172426308 035 $a(EXLCZ)993710000000078629 100 $a20130907d2014 u| 0 101 0 $aeng 135 $aurnn|008mamaa 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aPhotoelectron Spectroscopy$b[electronic resource] $eBulk and Surface Electronic Structures /$fby Shigemasa Suga, Akira Sekiyama 205 $a1st ed. 2014. 210 1$aBerlin, Heidelberg :$cSpringer Berlin Heidelberg :$cImprint: Springer,$d2014. 215 $a1 online resource (XVIII, 378 p. 192 illus., 70 illus. in color.) 225 1 $aSpringer Series in Optical Sciences,$x0342-4111 ;$v176 300 $aBibliographic Level Mode of Issuance: Monograph 311 $a3-642-37529-4 327 $aTheoretical Background -- Instrumentation and Methodology -- Bulk and Surface Sensitivity of Photoelectron Spectroscopy -- Examples of Angle Integrated Photoelectron Spectroscopy -- Angle-Resolved Photoelectron Spectroscopy in HV-regions -- High Resolution Soft X-ray Angle-Integrated and -Resolved Photoelectron Spectroscopy of Correlated Electron Systems -- Very Low Photon Energy Photoelectron Spectroscopy -- Inverse Photoemission -- Photoelectron Diffraction -- Complementary Techniques for Studying Bulk Electronic Structures -- Surface Spectroscopy by Scanning Tunneling Microscope. 330 $aPhotoelectron spectroscopy is now becoming more and more required to investigate electronic structures of various solid materials in the bulk, on surfaces as well as at buried interfaces. The energy resolution was much improved in the last decade down to 1 meV in the low photon energy region. Now this technique is available from a few eV up to 10 keV by use of lasers, electron cyclotron resonance lamps in addition to synchrotron radiation and X-ray tubes. High resolution angle resolved photoelectron spectroscopy (ARPES) is now widely applied to band mapping of materials. It attracts a wide attention from both fundamental science and material engineering. Studies of the dynamics of excited states are feasible by time of flight spectroscopy with fully utilizing the pulse structures of synchrotron radiation as well as lasers including the free electron lasers (FEL). Spin resolved studies also made dramatic progress by using higher efficiency spin detectors and two dimensional spin detectors. Polarization dependent measurements in the whole photon energy spectrum of the spectra provide useful information on the symmetry of orbitals. The book deals with the fundamental concepts and approaches for the application of this technique to materials studies. Complementary techniques such as inverse photoemission, photoelectron diffraction, photon spectroscopy including infrared and X-ray and scanning tunneling spectroscopy are presented. This book provides not only a wide scope of photoelectron spectroscopy of solids but also extends our understanding of electronic structures beyond photoelectron spectroscopy. 410 0$aSpringer Series in Optical Sciences,$x0342-4111 ;$v176 606 $aLasers 606 $aPhotonics 606 $aOptics 606 $aElectrodynamics 606 $aSurfaces (Physics) 606 $aInterfaces (Physical sciences) 606 $aThin films 606 $aQuantum optics 606 $aPhysical chemistry 606 $aMaterials science 606 $aOptics, Lasers, Photonics, Optical Devices$3https://scigraph.springernature.com/ontologies/product-market-codes/P31030 606 $aClassical Electrodynamics$3https://scigraph.springernature.com/ontologies/product-market-codes/P21070 606 $aSurface and Interface Science, Thin Films$3https://scigraph.springernature.com/ontologies/product-market-codes/P25160 606 $aQuantum Optics$3https://scigraph.springernature.com/ontologies/product-market-codes/P24050 606 $aPhysical Chemistry$3https://scigraph.springernature.com/ontologies/product-market-codes/C21001 606 $aCharacterization and Evaluation of Materials$3https://scigraph.springernature.com/ontologies/product-market-codes/Z17000 615 0$aLasers. 615 0$aPhotonics. 615 0$aOptics. 615 0$aElectrodynamics. 615 0$aSurfaces (Physics). 615 0$aInterfaces (Physical sciences). 615 0$aThin films. 615 0$aQuantum optics. 615 0$aPhysical chemistry. 615 0$aMaterials science. 615 14$aOptics, Lasers, Photonics, Optical Devices. 615 24$aClassical Electrodynamics. 615 24$aSurface and Interface Science, Thin Films. 615 24$aQuantum Optics. 615 24$aPhysical Chemistry. 615 24$aCharacterization and Evaluation of Materials. 676 $a547.346 700 $aSuga$b Shigemasa$4aut$4http://id.loc.gov/vocabulary/relators/aut$0791880 702 $aSekiyama$b Akira$4aut$4http://id.loc.gov/vocabulary/relators/aut 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910300384003321 996 $aPhotoelectron Spectroscopy$92530445 997 $aUNINA