LEADER 03350nam  22005655  450 
001 9910299951203321
005 20200705054549.0
010   $a3-319-75465-3
024 7 $a10.1007/978-3-319-75465-9
035   $a(CKB)4100000003359397
035   $a(MiAaPQ)EBC5355955
035   $a(DE-He213)978-3-319-75465-9
035   $a(PPN)22669688X
035   $a(EXLCZ)994100000003359397
100   $a20180418d2018      u|         0
101 0 $aeng
135   $aurcnu||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aTiming Performance of Nanometer Digital Circuits Under Process Variations /$fby Victor Champac, Jose Garcia Gervacio
205   $a1st ed. 2018.
210  1$aCham :$cSpringer International Publishing :$cImprint: Springer,$d2018.
215   $a1 online resource (195 pages)
225 1 $aFrontiers in Electronic Testing,$x0929-1296 ;$v39
311   $a3-319-75464-5 
327   $aIntroduction -- Mathematical Fundamentals -- Process Variations -- Gate delay under process variations -- Path Delay Under Process Variations -- Circuit Analysis under Process Variations -- FinFET Technology and design issues.
330   $aThis book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-step methodology, going from logic gates to logic paths to the circuit level. Topics are presented in comprehensively, without overwhelming use of analytical formulations. Emphasis is placed on providing digital designers with understanding of the sources of process variations, their impact on circuit performance and tools for improving their designs to comply with product specifications. Various circuit-level ?design hints? are highlighted, so that readers can use then to improve their designs. A special treatment is devoted to unique design issues and the impact of process variations on the performance of FinFET based circuits. This book enables readers to make optimal decisions at design time, toward more efficient circuits, with better yield and higher reliability.
410  0$aFrontiers in Electronic Testing,$x0929-1296 ;$v39
606   $aElectronic circuits
606   $aMicroprocessors
606   $aElectronics
606   $aMicroelectronics
606   $aCircuits and Systems$3https://scigraph.springernature.com/ontologies/product-market-codes/T24068
606   $aProcessor Architectures$3https://scigraph.springernature.com/ontologies/product-market-codes/I13014
606   $aElectronics and Microelectronics, Instrumentation$3https://scigraph.springernature.com/ontologies/product-market-codes/T24027
615  0$aElectronic circuits.
615  0$aMicroprocessors.
615  0$aElectronics.
615  0$aMicroelectronics.
615 14$aCircuits and Systems.
615 24$aProcessor Architectures.
615 24$aElectronics and Microelectronics, Instrumentation.
676   $a621.381
700   $aChampac$b Victor$4aut$4http://id.loc.gov/vocabulary/relators/aut$01062007
702   $aGarcia Gervacio$b Jose$4aut$4http://id.loc.gov/vocabulary/relators/aut
906   $aBOOK
912   $a9910299951203321
996   $aTiming Performance of Nanometer Digital Circuits Under Process Variations$92521983
997   $aUNINA