LEADER 03304nam  22005175  450 
001 9910299940003321
005 20200702122649.0
010   $a3-319-77718-1
024 7 $a10.1007/978-3-319-77718-4
035   $a(CKB)4100000003359552
035   $a(MiAaPQ)EBC5341268
035   $a(DE-He213)978-3-319-77718-4
035   $a(PPN)226699196
035   $a(EXLCZ)994100000003359552
100   $a20180403d2018      u|         0
101 0 $aeng
135   $aurcnu||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aAccurate and Robust Spectral Testing with Relaxed Instrumentation Requirements /$fby Yuming Zhuang, Degang Chen
205   $a1st ed. 2018.
210  1$aCham :$cSpringer International Publishing :$cImprint: Springer,$d2018.
215   $a1 online resource (176 pages)
311   $a3-319-77717-3 
327   $aChapter 1. Introduction -- Chapter 2.Algorithms for accurate spectral analysis in the presence of arbitrary non-coherency and large distortion -- Chapter 3.Accurate spectral testing with arbitrary non- coherency in sampling and simultaneous drifts in amplitude and frequency -- Chapter 4.High-purity sine wave generation using nonlinear DAC with pre-distortion based on low-cost accurate DAC-ADC co-testing -- Chapter 5.Low cost ultra-pure sine wave generation with self-calibration -- Chapter 6.Accurate spectral testing with non-coherent sampling for multi-tone test -- Chapter 7.Accurate spectral testing with impure test stimulus for multi-tone test -- Chapter 8.Multi-tone sine wave generation achieving the theoretical minimum of peak-to-average power ratio -- Chapter 9.Accurate linearity testing using low purity stimulus robust against flicker noise -- Chapter 10.Summary.
330   $aThis book introduces a family of new methods for accurate and robust spectral testing and fills an information gap, as the requirements in standard test have grown increasingly challenging in recent high precision testing, especially as the device performance has continued to improve. Test engineers will be enabled to accurately set their devices & systems at much simpler test setup, much reduced complexity and much lower cost.
606   $aElectronic circuits
606   $aElectronics
606   $aMicroelectronics
606   $aCircuits and Systems$3https://scigraph.springernature.com/ontologies/product-market-codes/T24068
606   $aElectronic Circuits and Devices$3https://scigraph.springernature.com/ontologies/product-market-codes/P31010
606   $aElectronics and Microelectronics, Instrumentation$3https://scigraph.springernature.com/ontologies/product-market-codes/T24027
615  0$aElectronic circuits.
615  0$aElectronics.
615  0$aMicroelectronics.
615 14$aCircuits and Systems.
615 24$aElectronic Circuits and Devices.
615 24$aElectronics and Microelectronics, Instrumentation.
676   $a621.381
700   $aZhuang$b Yuming$4aut$4http://id.loc.gov/vocabulary/relators/aut$01059306
702   $aChen$b Degang$4aut$4http://id.loc.gov/vocabulary/relators/aut
906   $aBOOK
912   $a9910299940003321
996   $aAccurate and Robust Spectral Testing with Relaxed Instrumentation Requirements$92505254
997   $aUNINA