LEADER 02334oam 2200577 450 001 9910713310103321 005 20200413094118.0 035 $a(CKB)5470000002500547 035 $a(OCoLC)681140944$z(OCoLC)624868841$z(OCoLC)667893025 035 $a(OCoLC)995470000002500547 035 $a(EXLCZ)995470000002500547 100 $a20101111f19841985 ua 0 101 0 $aeng 135 $aurbn||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aSimulated effects of increased recharge on the ground-water flow system of Yucca Mountain and vicinity, Nevada-California /$fby John B. Czarnecki 210 1$aDenver, Colorado :$cU.S. Geological Survey,$d1985. 215 $a1 online resource (vi, 33 leaves) $cillustrations, maps 225 1 $aWater-resources investigations report ;$v84-4344 300 $a"Prepared in cooperation with the U.S. Department of Energy." 320 $aIncludes bibliographical references (leaves 32-33). 320 $aIncludes bibliographical references (pages 32-33). 606 $aArtificial groundwater recharge$xEnvironmental aspects$zNevada$zYucca Mountain 606 $aArtificial groundwater recharge$xEnvironmental aspects$zCalifornia 606 $aGroundwater$zNevada$zYucca Mountain 606 $aRadioactive wastes$xEnvironmental aspects$zNevada$zYucca Mountain 606 $aGroundwater$xEnvironmental aspects$2fast 606 $aRadioactive wastes$2fast 607 $aNevada$zYucca Mountain$2fast 615 0$aArtificial groundwater recharge$xEnvironmental aspects 615 0$aArtificial groundwater recharge$xEnvironmental aspects 615 0$aGroundwater 615 0$aRadioactive wastes$xEnvironmental aspects 615 7$aGroundwater$xEnvironmental aspects. 615 7$aRadioactive wastes. 700 $aCzarnecki$b John B.$01400705 712 02$aGeological Survey (U.S.), 712 02$aUnited States.$bDepartment of Energy. 801 0$bOCLCE 801 1$bOCLCE 801 2$bOCLCQ 801 2$bOCLCO 801 2$bOCLCQ 801 2$bOCLCF 801 2$bGPO 906 $aBOOK 912 $a9910713310103321 996 $aSimulated effects of increased recharge on the ground-water flow system of Yucca Mountain and vicinity, Nevada-California$93497541 997 $aUNINA LEADER 03866nam 22006135 450 001 9910299881003321 005 20200706060644.0 010 $a3-319-62920-4 024 7 $a10.1007/978-3-319-62920-9 035 $a(CKB)4100000001040689 035 $a(DE-He213)978-3-319-62920-9 035 $a(MiAaPQ)EBC5143854 035 $a(PPN)221247548 035 $a(EXLCZ)994100000001040689 100 $a20171110d2018 u| 0 101 0 $aeng 135 $aurnn|008mamaa 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$aLanguages, Design Methods, and Tools for Electronic System Design $eSelected Contributions from FDL 2016 /$fedited by Franco Fummi, Robert Wille 205 $a1st ed. 2018. 210 1$aCham :$cSpringer International Publishing :$cImprint: Springer,$d2018. 215 $a1 online resource (VII, 116 p. 61 illus., 48 illus. in color.) 225 1 $aLecture Notes in Electrical Engineering,$x1876-1100 ;$v454 311 $a3-319-62919-0 320 $aIncludes bibliographical references at the end of each chapters and index. 327 $aChapter1. Knowing Your AMS System's Limits: System Acceptance Region Exploration by Using Automated Model Refinement and Accelerated Simulation -- Chapter2. Designing Reliable Cyber-Physical Systems -- Chapter3. On the Application of Formal Fault Localization to Automated RTL-to-TLM Fault Correspondence Analysis for Fast and Accurate VP-based Error Effect Simulation - A Case Study -- Chapter4. Selective Abstraction and Stochastic Methods for Scalable Power Modelling of Heterogeneous Systems -- Chapter5. Feature based State Space Coverage of Analog Circuits -- Chapter6. Error-free Near-threshold Adiabatic CMOS Logic in Presence of Process Variation. 330 $aThis book brings together a selection of the best papers from the nineteenth edition of the Forum on specification and Design Languages Conference (FDL), which took place on September 14-16, 2016, in Bremen, Germany. FDL is a well-established international forum devoted to dissemination of research results, practical experiences and new ideas in the application of specification, design and verification languages to the design, modeling and verification of integrated circuits, complex hardware/software embedded systems, and mixed-technology systems. · Covers analog-mixed signal design techniques; · Includes descriptions of methods for reliable system design as well as fault localization; · Introduces stochastic methods for power modeling; · Covers design techniques for analog and adiabatic circuits. 410 0$aLecture Notes in Electrical Engineering,$x1876-1100 ;$v454 606 $aElectronic circuits 606 $aMicroprocessors 606 $aElectronics 606 $aMicroelectronics 606 $aCircuits and Systems$3https://scigraph.springernature.com/ontologies/product-market-codes/T24068 606 $aProcessor Architectures$3https://scigraph.springernature.com/ontologies/product-market-codes/I13014 606 $aElectronics and Microelectronics, Instrumentation$3https://scigraph.springernature.com/ontologies/product-market-codes/T24027 615 0$aElectronic circuits. 615 0$aMicroprocessors. 615 0$aElectronics. 615 0$aMicroelectronics. 615 14$aCircuits and Systems. 615 24$aProcessor Architectures. 615 24$aElectronics and Microelectronics, Instrumentation. 676 $a004.0151 702 $aFummi$b Franco$4edt$4http://id.loc.gov/vocabulary/relators/edt 702 $aWille$b Robert$4edt$4http://id.loc.gov/vocabulary/relators/edt 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910299881003321 996 $aLanguages, design methods, and tools for electronic system design$91465989 997 $aUNINA