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010   $a3-319-67870-1
024 7 $a10.1007/978-3-319-67870-2
035   $a(CKB)4100000000881535
035   $a(DE-He213)978-3-319-67870-2
035   $a(MiAaPQ)EBC5116880
035   $z(PPN)258872969
035   $a(PPN)220128561
035   $a(EXLCZ)994100000000881535
100   $a20171030d2018      u|         0
101 0 $aeng
135   $aurnn|008mamaa
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aTantalum and Niobium-Based Capacitors $eScience, Technology, and Applications   /$fby Yuri Freeman
205   $a1st ed. 2018.
210  1$aCham :$cSpringer International Publishing :$cImprint: Springer,$d2018.
215   $a1 online resource (XIX, 120 p. 109 illus., 57 illus. in color.) 
311   $a3-319-67869-8 
320   $aIncludes bibliographical references and index.
327   $aIntroduction -- Chap1:  Major Degradation Mechanisms -- Chap2: Basic Technology -- Chap3: Applications -- Conclusion.
330   $aThis book provides a comprehensive analysis of the science, technology, and applications of Tantalum and Niobium-based capacitors. The author discusses fundamentals, focusing on thermodynamic stability, major degradation processes and conduction mechanisms in the basic structure of Me-Me2O5-cathode (Me: Ta, Nb). Technology-related coverage includes chapters technology chapters on the major manufacturing steps from capacitor grade powder to the testing of finished capacitors. Applications discussed include high reliability, high charge and energy efficiency, high working voltages, high temperatures, etc. The links between the scientific foundation, breakthrough technologies and outstanding performance and reliability of the capacitors are demonstrated.  The theoretical models discussed include the thermodynamics of the amorphous dielectrics, conduction mechanisms in metal-insulator-semiconductor (MIS) structures, band diagrams of the organic semiconductors, etc. Provides a single-source reference to the science, technology, and applications of Tantalum and Niobium-based capacitors; Focuses on Polymer Tantalum capacitors, with rapidly growing applications in special and commercial electronics; Discusses in detail conduction and degradation mechanisms in amorphous dielectrics and multilayer capacitor structures with amorphous dielectrics, such as metal-insulator-semiconductor (MIS) structures with inorganic and organic semiconductors, as well as MOSFET transistors with high k dielectrics.
606   $aElectronic circuits
606   $aElectronics
606   $aMicroelectronics
606   $aCircuits and Systems$3https://scigraph.springernature.com/ontologies/product-market-codes/T24068
606   $aElectronic Circuits and Devices$3https://scigraph.springernature.com/ontologies/product-market-codes/P31010
606   $aElectronics and Microelectronics, Instrumentation$3https://scigraph.springernature.com/ontologies/product-market-codes/T24027
615  0$aElectronic circuits.
615  0$aElectronics.
615  0$aMicroelectronics.
615 14$aCircuits and Systems.
615 24$aElectronic Circuits and Devices.
615 24$aElectronics and Microelectronics, Instrumentation.
676   $a621.3815
700   $aFreeman$b Yuri$4aut$4http://id.loc.gov/vocabulary/relators/aut$01064398
906   $aBOOK
912   $a9910299877403321
996   $aTantalum and Niobium-Based Capacitors$92537851
997   $aUNINA