LEADER 04049nam  22007815  450 
001 9910299853003321
005 20200630035521.0
010   $a1-4939-1349-2
024 7 $a10.1007/978-1-4939-1349-7
035   $a(CKB)3710000000311456
035   $a(EBL)1965012
035   $a(OCoLC)897810230
035   $a(SSID)ssj0001408104
035   $a(PQKBManifestationID)11746684
035   $a(PQKBTitleCode)TC0001408104
035   $a(PQKBWorkID)11341445
035   $a(PQKB)10984458
035   $a(DE-He213)978-1-4939-1349-7
035   $a(MiAaPQ)EBC1965012
035   $a(PPN)183147960
035   $a(EXLCZ)993710000000311456
100   $a20141203d2015      u|         0
101 0 $aeng
135   $aur|n|---|||||
181   $ctxt
182   $cc
183   $acr
200 10$aCMOS Test and Evaluation $eA Physical Perspective /$fby Manjul Bhushan, Mark B. Ketchen
205   $a1st ed. 2015.
210  1$aNew York, NY :$cSpringer New York :$cImprint: Springer,$d2015.
215   $a1 online resource (431 p.)
300   $aDescription based upon print version of record.
311   $a1-4939-1348-4 
320   $aIncludes bibliographical references and index.
327   $aIntroduction -- CMOS Circuit Basics -- CMOS Storage Elements and Synchronous Logic -- IDDQ and Power -- Embedded PVT Monitors -- Variability -- Product Chip Test and Characterization -- Reliability, Burn-In and Guardbands -- Data Analysis and Characterization -- CMOS Metrics and Model Evaluation.
330   $aThis book extends test structure applications described in Microelectronic Test Struc­tures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and product test data from a basic knowledge of the physical behavior of the constituent components. Elementary circuits that exhibit key properties of complex CMOS chips are simulated and analyzed, and an integrated view of design, test and characterization is developed. Appropriately designed circuit monitors embedded in the CMOS chip serve to correlate CMOS technology models and circuit design tools to the hardware and also aid in test debug. Impact of silicon process variability, reliability, and power and performance sensitivities to a range of product application conditions are described. Circuit simulations exemplify the methodologies presented, and problems are included at the end of the chapters.
606   $aElectronics
606   $aMicroelectronics
606   $aElectronic circuits
606   $aSemiconductors
606   $aQuality control
606   $aReliability
606   $aIndustrial safety
606   $aElectronics and Microelectronics, Instrumentation$3https://scigraph.springernature.com/ontologies/product-market-codes/T24027
606   $aCircuits and Systems$3https://scigraph.springernature.com/ontologies/product-market-codes/T24068
606   $aSemiconductors$3https://scigraph.springernature.com/ontologies/product-market-codes/P25150
606   $aQuality Control, Reliability, Safety and Risk$3https://scigraph.springernature.com/ontologies/product-market-codes/T22032
615  0$aElectronics.
615  0$aMicroelectronics.
615  0$aElectronic circuits.
615  0$aSemiconductors.
615  0$aQuality control.
615  0$aReliability.
615  0$aIndustrial safety.
615 14$aElectronics and Microelectronics, Instrumentation.
615 24$aCircuits and Systems.
615 24$aSemiconductors.
615 24$aQuality Control, Reliability, Safety and Risk.
676   $a537.622
676   $a620
676   $a621.381
676   $a621.3815
700   $aBhushan$b Manjul$4aut$4http://id.loc.gov/vocabulary/relators/aut$0720769
702   $aKetchen$b Mark B$4aut$4http://id.loc.gov/vocabulary/relators/aut
906   $aBOOK
912   $a9910299853003321
996   $aCMOS Test and Evaluation$92505958
997   $aUNINA