LEADER 04725nam 22008295 450 001 9910299695303321 005 20200705054616.0 010 $a3-662-44482-8 024 7 $a10.1007/978-3-662-44482-5 035 $a(CKB)3710000000239432 035 $a(EBL)1967805 035 $a(OCoLC)891673894 035 $a(SSID)ssj0001353946 035 $a(PQKBManifestationID)11854998 035 $a(PQKBTitleCode)TC0001353946 035 $a(PQKBWorkID)11316844 035 $a(PQKB)10613005 035 $a(DE-He213)978-3-662-44482-5 035 $a(MiAaPQ)EBC1967805 035 $a(PPN)181353229 035 $a(EXLCZ)993710000000239432 100 $a20140915d2015 u| 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aComparators in Nanometer CMOS Technology$b[electronic resource] /$fby Bernhard Goll, Horst Zimmermann 205 $a1st ed. 2015. 210 1$aBerlin, Heidelberg :$cSpringer Berlin Heidelberg :$cImprint: Springer,$d2015. 215 $a1 online resource (259 p.) 225 1 $aSpringer Series in Advanced Microelectronics,$x1437-0387 ;$v50 300 $aDescription based upon print version of record. 311 $a3-662-44481-X 320 $aIncludes bibliographical references and index. 327 $aFundamentals of clocked, regenerative comparators -- State-of-the-art nanometer CMOS -- Measurement circuits and setup -- Comparators in 120 nm CMOS -- Comparators in 65 nm CMOS -- Conclusions and comparison. 330 $aThis book covers the complete spectrum of the fundamentals of clocked, regenerative comparators, their state-of-the-art, advanced CMOS technologies, innovative comparators inclusive circuit aspects, their characterization and properties. Starting from the basics of comparators and the transistor characteristics in nanometer CMOS, seven high-performance comparators developed by the authors in 120nm and 65nm CMOS are described extensively. Methods and measurement circuits for the characterization of advanced comparators are introduced. A synthesis of the largely differing aspects of demands on modern comparators and the properties of devices being available in nanometer CMOS, which are posed by the so-called nanometer hell of physics, is accomplished. The book summarizes the state of the art in integrated comparators. Advanced measurement circuits for characterization will be introduced as well as the method of characterization by bit-error analysis usually being used for characterization of optical receivers. The book is compact, and the graphical quality of the illustrations is outstanding. This book is written for engineers and researchers in industry as well as scientists and Ph.D students at universities. It is also recommendable to graduate students specializing on nanoelectronics and microelectronics or circuit design. 410 0$aSpringer Series in Advanced Microelectronics,$x1437-0387 ;$v50 606 $aElectronic circuits 606 $aNuclear physics 606 $aHeavy ions 606 $aNanotechnology 606 $aElectronics 606 $aMicroelectronics 606 $aMaterials science 606 $aCircuits and Systems$3https://scigraph.springernature.com/ontologies/product-market-codes/T24068 606 $aNuclear Physics, Heavy Ions, Hadrons$3https://scigraph.springernature.com/ontologies/product-market-codes/P23010 606 $aNanotechnology and Microengineering$3https://scigraph.springernature.com/ontologies/product-market-codes/T18000 606 $aElectronics and Microelectronics, Instrumentation$3https://scigraph.springernature.com/ontologies/product-market-codes/T24027 606 $aCharacterization and Evaluation of Materials$3https://scigraph.springernature.com/ontologies/product-market-codes/Z17000 615 0$aElectronic circuits. 615 0$aNuclear physics. 615 0$aHeavy ions. 615 0$aNanotechnology. 615 0$aElectronics. 615 0$aMicroelectronics. 615 0$aMaterials science. 615 14$aCircuits and Systems. 615 24$aNuclear Physics, Heavy Ions, Hadrons. 615 24$aNanotechnology and Microengineering. 615 24$aElectronics and Microelectronics, Instrumentation. 615 24$aCharacterization and Evaluation of Materials. 676 $a539.7092 676 $a620 676 $a620.11 676 $a620.5 700 $aGoll$b Bernhard$4aut$4http://id.loc.gov/vocabulary/relators/aut$0720755 702 $aZimmermann$b Horst$4aut$4http://id.loc.gov/vocabulary/relators/aut 906 $aBOOK 912 $a9910299695303321 996 $aComparators in Nanometer CMOS Technology$92531585 997 $aUNINA