LEADER 04125nam 22006615 450 001 9910299694903321 005 20200701002412.0 010 $a3-319-10819-0 024 7 $a10.1007/978-3-319-10819-3 035 $a(CKB)3710000000375625 035 $a(EBL)1998663 035 $a(SSID)ssj0001465638 035 $a(PQKBManifestationID)11896966 035 $a(PQKBTitleCode)TC0001465638 035 $a(PQKBWorkID)11486995 035 $a(PQKB)10855588 035 $a(DE-He213)978-3-319-10819-3 035 $a(MiAaPQ)EBC1998663 035 $a(PPN)184887844 035 $a(EXLCZ)993710000000375625 100 $a20150310d2015 u| 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aOn-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits /$fby Qiang Cui, Juin J. Liou, Jean-Jacques Hajjar, Javier Salcedo, Yuanzhong Zhou, Parthasarathy Srivatsan 205 $a1st ed. 2015. 210 1$aCham :$cSpringer International Publishing :$cImprint: Springer,$d2015. 215 $a1 online resource (99 p.) 300 $aDescription based upon print version of record. 311 $a3-319-10818-2 320 $aIncludes bibliographical references. 327 $aBasics in ESD Protection of Radio Frequency Integrated Circuits -- On-Chip Protection Solution for Radio Frequency Integrated Circuits in Standard CMOS Process -- Design of SiGe SCR devices for Radio Frequency Integrated Circuits in SiGe BiCMOS Process -- On-Chip Radio Frequency ESD Protection Solution in GaAs pHEMT Process -- Conclusion. 330 $aThis book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices. The authors describe in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies. Readers will benefit from realistic case studies of ESD protection for RFICs and will learn to increase significantly modern RFICs? ESD safety level, while maximizing RF performance. Describes in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies; Enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS); Includes realistic case studies of ESD protection for RFICs that resulted in significantly increased ESD safety level, while maximizing RF performance. 606 $aElectronic circuits 606 $aElectronics 606 $aMicroelectronics 606 $aCircuits and Systems$3https://scigraph.springernature.com/ontologies/product-market-codes/T24068 606 $aElectronic Circuits and Devices$3https://scigraph.springernature.com/ontologies/product-market-codes/P31010 606 $aElectronics and Microelectronics, Instrumentation$3https://scigraph.springernature.com/ontologies/product-market-codes/T24027 615 0$aElectronic circuits. 615 0$aElectronics. 615 0$aMicroelectronics. 615 14$aCircuits and Systems. 615 24$aElectronic Circuits and Devices. 615 24$aElectronics and Microelectronics, Instrumentation. 676 $a621.3815 700 $aCui$b Qiang$4aut$4http://id.loc.gov/vocabulary/relators/aut$01059726 702 $aLiou$b Juin J$4aut$4http://id.loc.gov/vocabulary/relators/aut 702 $aHajjar$b Jean-Jacques$4aut$4http://id.loc.gov/vocabulary/relators/aut 702 $aSalcedo$b Javier$4aut$4http://id.loc.gov/vocabulary/relators/aut 702 $aZhou$b Yuanzhong$4aut$4http://id.loc.gov/vocabulary/relators/aut 702 $aSrivatsan$b Parthasarathy$4aut$4http://id.loc.gov/vocabulary/relators/aut 906 $aBOOK 912 $a9910299694903321 996 $aOn-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits$92507767 997 $aUNINA