LEADER 04405nam 22007335 450 001 9910299614503321 005 20251113211803.0 010 $a81-322-2132-X 024 7 $a10.1007/978-81-322-2132-6 035 $a(CKB)3710000000277685 035 $a(EBL)1967548 035 $a(OCoLC)908087387 035 $a(SSID)ssj0001386410 035 $a(PQKBManifestationID)11994455 035 $a(PQKBTitleCode)TC0001386410 035 $a(PQKBWorkID)11374688 035 $a(PQKB)10353377 035 $a(DE-He213)978-81-322-2132-6 035 $a(MiAaPQ)EBC1967548 035 $a(PPN)18309414X 035 $a(EXLCZ)993710000000277685 100 $a20141107d2015 u| 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aCompact Models and Performance Investigations for Subthreshold Interconnects /$fby Rohit Dhiman, Rajeevan Chandel 205 $a1st ed. 2015. 210 1$aNew Delhi :$cSpringer India :$cImprint: Springer,$d2015. 215 $a1 online resource (122 p.) 225 1 $aEnergy Systems in Electrical Engineering,$x2199-8590 300 $aDescription based upon print version of record. 311 08$a81-322-2131-1 320 $aIncludes bibliographical references at the end of each chapters. 327 $aIntroduction -- Design Challenges in Sub-threshold Interconnect Circuits -- Sub-threshold Interconnect Circuit Design -- Characterization of Dynamic Crosstalk Effect In Sub-threshold Interconnects -- Sub-threshold Interconnect Noise Analysis -- Variability in Sub-threshold Interconnects. 330 $aCompact Models and Performance Investigations for Sub-threshold Interconnects provides a detailed analysis of issues related to sub-threshold interconnect performance from the perspective of analytical approach and design techniques. Particular emphasis is laid on the performance analysis of coupling noise and variability issues in sub-threshold domain to develop efficient compact models. The proposed analytical approach gives physical insight of the parameters affecting the transient behavior of coupled interconnects. Remedial design techniques are also suggested to mitigate the effect of coupling noise. The effects of wire width, spacing between the wires, wire length are thoroughly investigated. In addition, the effect of parameters like driver strength on peak coupling noise has also been analyzed. Process, voltage and temperature variations are prominent factors affecting sub-threshold design and have also been investigated. The process variability analysis has been carried out using parametric analysis, process corner analysis and Monte Carlo technique. The book also provides a qualitative summary of the work reported in the literature by various researchers in the design of digital sub-threshold circuits. This book should be of interest for researchers and graduate students with deeper insights into sub-threshold interconnect models in particular. In this sense, this book will best fit as a text book and/or a reference book for students who are initiated in the area of research and advanced courses in nanotechnology, interconnect design and modeling. 410 0$aEnergy Systems in Electrical Engineering,$x2199-8590 606 $aElectronic circuits 606 $aElectronics 606 $aElectric power production 606 $aSignal processing 606 $aElectronic Circuits and Systems 606 $aElectronics and Microelectronics, Instrumentation 606 $aElectrical Power Engineering 606 $aSignal, Speech and Image Processing 615 0$aElectronic circuits. 615 0$aElectronics. 615 0$aElectric power production. 615 0$aSignal processing. 615 14$aElectronic Circuits and Systems. 615 24$aElectronics and Microelectronics, Instrumentation. 615 24$aElectrical Power Engineering. 615 24$aSignal, Speech and Image Processing. 676 $a621.38173 700 $aDhiman$b Rohit$4aut$4http://id.loc.gov/vocabulary/relators/aut$0978132 702 $aChandel$b Rajeevan$4aut$4http://id.loc.gov/vocabulary/relators/aut 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910299614503321 996 $aCompact Models and Performance Investigations for Subthreshold Interconnects$92228335 997 $aUNINA