LEADER 03532nam 2200589Ia 450 001 9910299494203321 005 20200520144314.0 010 $a3-319-00533-2 024 7 $a10.1007/978-3-319-00533-1 035 $a(CKB)2560000000104421 035 $a(EBL)1317385 035 $a(SSID)ssj0000935453 035 $a(PQKBManifestationID)11563301 035 $a(PQKBTitleCode)TC0000935453 035 $a(PQKBWorkID)10955233 035 $a(PQKB)11143134 035 $a(MiAaPQ)EBC1317385 035 $a(DE-He213)978-3-319-00533-1 035 $a(iGPub)SPNA0027191 035 $a(PPN)19053429X 035 $a(EXLCZ)992560000000104421 100 $a20130424d2013 uy 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aTrace-based post-silicon validation for VLSI circuits /$fXiao Lu and Qiang Xu 205 $a1st ed. 2014. 210 $aNew York $cSpringer$d2013 215 $a1 online resource (118 p.) 225 0 $aLecture notes in electrical engineering ;$v252 300 $aDescription based upon print version of record. 311 $a3-319-00532-4 320 $aIncludes bibliographical references and index. 327 $aIntroduction -- State of the Art on Post-Silicon Validation -- Signal Selection for Visibility Enhancement -- Multiplexed Tracing for Design Error -- Tracing for Electrical Error -- Reusing Test Access Mechanisms -- Interconnection Fabric for Flexible Tracing -- Interconnection Fabric for Systematic Tracing -- Conclusion. 330 $aThis book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits.  The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and cost-effective.  A series of automatic tracing solutions and innovative design for debug (DfD) techniques are described, including techniques for trace signal selection for enhancing visibility of functional errors, a multiplexed signal tracing strategy for improving functional error detection, a tracing solution for debugging electrical errors, an interconnection fabric for increasing data bandwidth and supporting multi-core debug, an interconnection fabric design and optimization technique to increase transfer flexibility and a DfD design and associated tracing solution for improving debug efficiency and expanding tracing window. The solutions presented in this book improve the validation quality of VLSI circuits, and ultimately enable the design and fabrication of reliable electronic devices. ·         Provides a comprehensive summary of state-of-the-art on post-silicon validation; ·         Offers automated solutions that are systematic and cost-effective for post-silicon validation, from trace signal selection to trace data transfer; ·         Illustrate key concepts and algorithms with real examples.        . 410 0$aLecture Notes in Electrical Engineering,$x1876-1100 ;$v252 606 $aElectrical engineering 606 $aSilicon 615 0$aElectrical engineering. 615 0$aSilicon. 676 $a621.395 700 $aLu$b Xiao$01757892 701 $aXu$b Qiang$01179417 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910299494203321 996 $aTrace-based post-silicon validation for VLSI circuits$94195909 997 $aUNINA