LEADER 02733oam 2200481 450 001 9910299461103321 005 20190911103512.0 010 $a1-4614-1761-9 024 7 $a10.1007/978-1-4614-1761-3 035 $a(OCoLC)869771732 035 $a(MiFhGG)GVRL6VHV 035 $a(EXLCZ)993710000000024992 100 $a20130812d2014 uy 0 101 0 $aeng 135 $aurun|---uuuua 181 $ctxt 182 $cc 183 $acr 200 10$aDesign for manufacturability $efrom 1D to 4D for 90-22 nm technology nodes /$fArtur Balasinski 205 $a1st ed. 2014. 210 1$aNew York :$cSpringer,$d2014. 215 $a1 online resource (viii, 278 pages) $cillustrations (some color) 225 0 $aGale eBooks 300 $aDescription based upon print version of record. 311 $a1-4614-1760-0 320 $aIncludes bibliographical references. 327 $aPreface -- Classic DfM: from 2D to 3D -- DfM at 28 nm and Beyond -- New DfM Domain: Stress Effects -- Conclusions and Future Work. 330 $aThis book explains integrated circuit design for manufacturability (DfM) at the product level (packaging, applications) and applies engineering DfM principles to the latest standards of product development at 22 nm technology nodes.  It is a valuable guide for layout designers, packaging engineers and quality engineers, covering DfM development from 1D to 4D, involving IC design flow setup, best practices, links to manufacturing and product definition, for process technologies down to 22 nm node, and product families including memories, logic, system-on-chip and system-in-package. ·         Provides design for manufacturability guidelines on layout techniques for the most advanced, 22 nm  technology nodes; ·         Includes information valuable to layout designers, packaging engineers and quality engineers, working on memories, logic, system-on-chip and system-in-package;  ·         Offers a highly-accessible, single-source reference to information otherwise available only from disparate sources; ·         Helps readers to translate reliability methodology into real design flows. 606 $aElectronic circuit design 606 $aIntegrated circuits$xDesign and construction 615 0$aElectronic circuit design. 615 0$aIntegrated circuits$xDesign and construction. 676 $a620 676 $a621.381 676 $a621.3815 676 $a658.56 700 $aBalasinski$b Artur$4aut$4http://id.loc.gov/vocabulary/relators/aut$0987540 801 0$bMiFhGG 801 1$bMiFhGG 906 $aBOOK 912 $a9910299461103321 996 $aDesign for Manufacturability$92257528 997 $aUNINA