LEADER 04992nam 22006495 450 001 9910299212203321 005 20200703161100.0 010 $a1-4471-6741-4 024 7 $a10.1007/978-1-4471-6741-9 035 $a(CKB)3710000000478612 035 $a(EBL)4177991 035 $a(SSID)ssj0001584271 035 $a(PQKBManifestationID)16265050 035 $a(PQKBTitleCode)TC0001584271 035 $a(PQKBWorkID)14864708 035 $a(PQKB)10915982 035 $a(DE-He213)978-1-4471-6741-9 035 $a(MiAaPQ)EBC4177991 035 $a(PPN)19053320X 035 $a(EXLCZ)993710000000478612 100 $a20150924d2015 u| 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aIntegrated Imaging and Vision Techniques for Industrial Inspection $eAdvances and Applications /$fedited by Zheng Liu, Hiroyuki Ukida, Pradeep Ramuhalli, Kurt Niel 205 $a1st ed. 2015. 210 1$aLondon :$cSpringer London :$cImprint: Springer,$d2015. 215 $a1 online resource (543 p.) 225 1 $aAdvances in Computer Vision and Pattern Recognition,$x2191-6586 300 $aDescription based upon print version of record. 311 $a1-4471-6740-6 320 $aIncludes bibliographical references at the end of each chapters and index. 327 $aIndustrial Inspection with Open Eyes -- Part I: Advances in Technology -- Infrared Vision -- Inspection Methods for Metal Surfaces -- FlexWarp, a Fast and Flexible Method for High-Precision Image Registration -- How Optical CMMs and 3D Scanning will Revolutionize the 3D Metrology World -- Fast Three-Dimensional Shape Inspection Using a Multi-Sided Mirror -- Efficient Completeness Inspection Using Real-Time 3D Color Reconstruction with a Dual-Laser Triangulation System -- X-Ray Computed Tomography for Non-Destructive Testing and Materials Characterization -- Defect Inspection for Curved Surfaces with a Highly Specular Reflection -- Part II: Applications and System Integration for Vision-Based Inspection -- Robotic Inspection Systems -- Machine Vision Techniques for Condition Assessment of Civil Infrastructure -- Smart Check 3D -- Ultrasonic Evaluation and Imaging -- Non-Destructive Visualization Using Electromagnetic Waves for Real and Practical Sensing Technology for Robotics -- Magneto-Optic Imaging and its Applications. 330 $aThis pioneering text/reference presents a detailed focus on the use of machine vision techniques in industrial inspection applications. An internationally renowned selection of experts provide insights on a range of inspection tasks, drawn from their cutting-edge work in academia and industry, covering practical issues of vision system integration for real-world applications.  Topics and features:  Presents a comprehensive review of state-of-the-art hardware and software tools for machine vision, and the evolution of algorithms for industrial inspection Includes in-depth descriptions of advanced inspection methodologies and machine vision technologies for specific needs Discusses the latest developments and future trends in imaging and vision techniques for industrial inspection tasks Provides a focus on imaging and vision system integration, implementation, and optimization Describes the pitfalls and barriers to developing successful inspection systems for smooth and efficient manufacturing process Bridging the gap between theoretical knowledge and engineering practice, this indispensable book will appeal to graduate students interested in imaging, machine vision, and industrial inspection. The work also serves as an excellent reference for researchers seeking to develop innovative solutions to tackle practical challenges, and for professional engineers who will benefit from the coverage of applications at both system and component level. 410 0$aAdvances in Computer Vision and Pattern Recognition,$x2191-6586 606 $aOptical data processing 606 $aPattern perception 606 $aImage Processing and Computer Vision$3https://scigraph.springernature.com/ontologies/product-market-codes/I22021 606 $aPattern Recognition$3https://scigraph.springernature.com/ontologies/product-market-codes/I2203X 615 0$aOptical data processing. 615 0$aPattern perception. 615 14$aImage Processing and Computer Vision. 615 24$aPattern Recognition. 676 $a658.568 702 $aLiu$b Zheng$4edt$4http://id.loc.gov/vocabulary/relators/edt 702 $aUkida$b Hiroyuki$4edt$4http://id.loc.gov/vocabulary/relators/edt 702 $aRamuhalli$b Pradeep$4edt$4http://id.loc.gov/vocabulary/relators/edt 702 $aNiel$b Kurt$4edt$4http://id.loc.gov/vocabulary/relators/edt 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910299212203321 996 $aIntegrated Imaging and Vision Techniques for Industrial Inspection$92520006 997 $aUNINA