LEADER 04689nam 22008415 450 001 9910298632903321 005 20200701060401.0 010 $a3-319-15588-1 024 7 $a10.1007/978-3-319-15588-3 035 $a(CKB)3710000000415703 035 $a(EBL)2096875 035 $a(SSID)ssj0001500947 035 $a(PQKBManifestationID)11771810 035 $a(PQKBTitleCode)TC0001500947 035 $a(PQKBWorkID)11522319 035 $a(PQKB)11189203 035 $a(DE-He213)978-3-319-15588-3 035 $a(MiAaPQ)EBC2096875 035 $a(PPN)186030517 035 $a(EXLCZ)993710000000415703 100 $a20150518d2015 u| 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aNoncontact Atomic Force Microscopy $eVolume 3 /$fedited by Seizo Morita, Franz J. Giessibl, Ernst Meyer, Roland Wiesendanger 205 $a1st ed. 2015. 210 1$aCham :$cSpringer International Publishing :$cImprint: Springer,$d2015. 215 $a1 online resource (539 p.) 225 1 $aNanoScience and Technology,$x1434-4904 300 $aDescription based upon print version of record. 311 $a3-319-15587-3 320 $aIncludes bibliographical references at the end of each chapters and index. 327 $aFrom the Contents: Introduction -- 3D Force-Field Spectroscopy -- Simultaneous NC-AFM/STM Measurements of Atomic-Sized Contacts -- Spectroscopy and Manipulation Using AFM/STM at Room Temperature -- The Phantom Force - The Influence of a Tunnel Current on Force Microscopy -- Non-Contact Friction -- Magnetic Exchange Force Spectroscopy. 330 $aThis book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology. 410 0$aNanoScience and Technology,$x1434-4904 606 $aNanoscience 606 $aNanoscience 606 $aNanostructures 606 $aMaterials?Surfaces 606 $aThin films 606 $aSpectrum analysis 606 $aMicroscopy 606 $aNanotechnology 606 $aNanoscale Science and Technology$3https://scigraph.springernature.com/ontologies/product-market-codes/P25140 606 $aSurfaces and Interfaces, Thin Films$3https://scigraph.springernature.com/ontologies/product-market-codes/Z19000 606 $aSpectroscopy and Microscopy$3https://scigraph.springernature.com/ontologies/product-market-codes/P31090 606 $aNanotechnology$3https://scigraph.springernature.com/ontologies/product-market-codes/Z14000 615 0$aNanoscience. 615 0$aNanoscience. 615 0$aNanostructures. 615 0$aMaterials?Surfaces. 615 0$aThin films. 615 0$aSpectrum analysis. 615 0$aMicroscopy. 615 0$aNanotechnology. 615 14$aNanoscale Science and Technology. 615 24$aSurfaces and Interfaces, Thin Films. 615 24$aSpectroscopy and Microscopy. 615 24$aNanotechnology. 676 $a502.82 702 $aMorita$b Seizo$4edt$4http://id.loc.gov/vocabulary/relators/edt 702 $aGiessibl$b Franz J$4edt$4http://id.loc.gov/vocabulary/relators/edt 702 $aMeyer$b Ernst$4edt$4http://id.loc.gov/vocabulary/relators/edt 702 $aWiesendanger$b Roland$4edt$4http://id.loc.gov/vocabulary/relators/edt 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910298632903321 996 $aNoncontact Atomic Force Microscopy$92060878 997 $aUNINA