LEADER 03857nam 22006615 450 001 9910298632303321 005 20250609112013.0 010 $a3-662-45240-5 024 7 $a10.1007/978-3-662-45240-0 035 $a(CKB)3710000000360411 035 $a(EBL)1998099 035 $a(OCoLC)904046390 035 $a(SSID)ssj0001451976 035 $a(PQKBManifestationID)11759877 035 $a(PQKBTitleCode)TC0001451976 035 $a(PQKBWorkID)11478674 035 $a(PQKB)10412468 035 $a(DE-He213)978-3-662-45240-0 035 $a(MiAaPQ)EBC1998099 035 $a(PPN)184498260 035 $a(MiAaPQ)EBC4071778 035 $a(EXLCZ)993710000000360411 100 $a20150224d2015 u| 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aScanning Probe Microscopy $eAtomic Force Microscopy and Scanning Tunneling Microscopy /$fby Bert Voigtländer 205 $a1st ed. 2015. 210 1$aBerlin, Heidelberg :$cSpringer Berlin Heidelberg :$cImprint: Springer,$d2015. 215 $a1 online resource (375 p.) 225 1 $aNanoScience and Technology,$x1434-4904 300 $aDescription based upon print version of record. 311 08$a3-662-45239-1 320 $aIncludes bibliographical references and index. 327 $aIntroduction -- Harmonic Oscillator -- Technical Aspects of Scanning Probe Microscopy -- Scanning Probe Microscopy Designs -- Electronics for Scanning Probe Microscopy -- Lock-In Technique -- Data Representation and Image Processing -- Artifacts in SPM -- Work Function, Contact Potential, and Kelvin Probe Scanning Force Microscopy -- Surface States -- Forces Between Tip and Sample -- Technical Aspects of Atomic force Microscopy (AFM) -- Static Atomic Force Microscopy -- Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy -- Intermittent Contact Mode/Tapping Mode -- Mapping of Mechanical Properties Using Force-Distance Curves -- Frequency Modulation (FM) Mode in Dynamic Atomic Force Microscopy -- Noise in Atomic Force Microscopy -- Quartz Sensors in Atomic force Microscopy -- Scanning Tunneling Microscopy -- Scanning Tunneling Spectroscopy (STS) -- Vibrational Spectroscopy with the STM -- Spectroscopy and Imaging of Surface States -- Building Nanostructures Atom by Atom. 330 $aThis book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field. 410 0$aNanoScience and Technology,$x1434-4904 606 $aNanotechnology 606 $aCondensed matter 606 $aNanotechnology$3https://scigraph.springernature.com/ontologies/product-market-codes/Z14000 606 $aNanotechnology and Microengineering$3https://scigraph.springernature.com/ontologies/product-market-codes/T18000 606 $aCondensed Matter Physics$3https://scigraph.springernature.com/ontologies/product-market-codes/P25005 615 0$aNanotechnology. 615 0$aCondensed matter. 615 14$aNanotechnology. 615 24$aNanotechnology and Microengineering. 615 24$aCondensed Matter Physics. 676 $a502.82 700 $aVoigtländer$b Bert$4aut$4http://id.loc.gov/vocabulary/relators/aut$0770205 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910298632303321 996 $aScanning Probe Microscopy$92217267 997 $aUNINA