LEADER 05149nam 22008415 450 001 9910298462803321 005 20200706100250.0 010 $a1-4020-9311-X 024 7 $a10.1007/978-1-4020-9311-1 035 $a(CKB)3710000000121830 035 $a(EBL)1781928 035 $a(SSID)ssj0001274281 035 $a(PQKBManifestationID)11739356 035 $a(PQKBTitleCode)TC0001274281 035 $a(PQKBWorkID)11324343 035 $a(PQKB)11099441 035 $a(MiAaPQ)EBC1781928 035 $a(DE-He213)978-1-4020-9311-1 035 $a(PPN)179765744 035 $a(EXLCZ)993710000000121830 100 $a20140602d2014 u| 0 101 0 $aeng 135 $aur|n|---||||| 181 $ctxt 182 $cc 183 $acr 200 10$aCharacterisation of Ferroelectric Bulk Materials and Thin Films /$fedited by Markys G. Cain 205 $a1st ed. 2014. 210 1$aDordrecht :$cSpringer Netherlands :$cImprint: Springer,$d2014. 215 $a1 online resource (283 p.) 225 1 $aSpringer Series in Measurement Science and Technology,$x2198-7807 ;$v2 300 $aDescription based upon print version of record. 311 $a1-322-13179-1 311 $a1-4020-9310-1 320 $aIncludes bibliographical references at the end of each chapters and index. 327 $aElectrical Measurement of Ferroelectric Properties -- Piezoelectric Resonance -- Direct Piezoelectric Measurement - The Berlincourt Method -- Characterisation of Pyroelectric Materials -- Interferometry for Piezoelectric Materials and Thin Films -- Temperature Dependence of Ferroelectric and Piezoelectric Properties of PZT Ceramics -- Measurement and Modelling of Self-Heating in Piezoelectric Materials and Devices -- Piezoresponse Force Microscopy -- Indentation Stiffness Analysis of Ferroelectric Thin Films -- Losses in Piezoelectrics via Complex Resonance Analysis -- Dielectric Breakdown in Dielectrics and Ferroelectric Ceramics -- Standards for Piezoelectric and Ferroelectric Ceramics. 330 $aThis book presents a comprehensive review of the most important methods used in the characterisation of piezoelectric, ferroelectric and pyroelectric materials. It covers techniques for the analysis of bulk materials and thick and thin film materials and devices. There is a growing demand by industry to adapt and integrate piezoelectric materials into ever smaller devices and structures. Such applications development requires the joint development of reliable, robust, accurate and ? most importantly ? relevant and applicable measurement and characterisation methods and models. In the past few years there has been a rapid development of new techniques to model and measure the variety of properties that are deemed important for applications development engineers and scientists. The book has been written by the leaders in the field and many chapters represent established measurement best practice, with a strong emphasis on application of the methods via worked examples and detailed experimental procedural descriptions. Each chapter contains numerous diagrams, images, and measurement data, all of which are fully referenced and indexed. The book is intended to occupy space in the research or technical lab, and will be a valuable and practical resource for students, materials scientists, engineers, and lab technicians. 410 0$aSpringer Series in Measurement Science and Technology,$x2198-7807 ;$v2 606 $aMaterials science 606 $aPhysical measurements 606 $aMeasurement    606 $aMaterials?Surfaces 606 $aThin films 606 $aCeramics 606 $aGlass 606 $aComposites (Materials) 606 $aComposite materials 606 $aCharacterization and Evaluation of Materials$3https://scigraph.springernature.com/ontologies/product-market-codes/Z17000 606 $aMeasurement Science and Instrumentation$3https://scigraph.springernature.com/ontologies/product-market-codes/P31040 606 $aSurfaces and Interfaces, Thin Films$3https://scigraph.springernature.com/ontologies/product-market-codes/Z19000 606 $aCeramics, Glass, Composites, Natural Materials$3https://scigraph.springernature.com/ontologies/product-market-codes/Z18000 615 0$aMaterials science. 615 0$aPhysical measurements. 615 0$aMeasurement   . 615 0$aMaterials?Surfaces. 615 0$aThin films. 615 0$aCeramics. 615 0$aGlass. 615 0$aComposites (Materials). 615 0$aComposite materials. 615 14$aCharacterization and Evaluation of Materials. 615 24$aMeasurement Science and Instrumentation. 615 24$aSurfaces and Interfaces, Thin Films. 615 24$aCeramics, Glass, Composites, Natural Materials. 676 $a621.38152 702 $aCain$b Markys G$4edt$4http://id.loc.gov/vocabulary/relators/edt 801 0$bMiAaPQ 801 1$bMiAaPQ 801 2$bMiAaPQ 906 $aBOOK 912 $a9910298462803321 996 $aCharacterisation of Ferroelectric Bulk Materials and Thin Films$92511289 997 $aUNINA